Author :
Publisher :
Page : 417 pages
File Size : 50,24 MB
Release : 2001
Category : Integrated circuits
ISBN :
[PDF] Vlsi Test Symposium Vts 2001 eBook
Vlsi Test Symposium Vts 2001 Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of Vlsi Test Symposium Vts 2001 book. This book definitely worth reading, it is an incredibly well-written.
VLSI Test Symposium (Vts 2001)
IEEE Computer Society
Author : IEEE Computer Society
Publisher :
Page : 500 pages
File Size : 22,50 MB
Release : 2001-05
Category :
ISBN : 9780769511238
19th IEEE VLSI Test Symposium
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Page : 417 pages
File Size : 44,88 MB
Release : 2001
Category : Application-specific integrated circuits
ISBN : 9780769511238
IEEE VLSI Test Symposium
Author :
Publisher :
Page : 498 pages
File Size : 14,14 MB
Release : 2005
Category : Application-specific integrated circuits
ISBN :
19th IEEE VLSI Test Symposium
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Page : 458 pages
File Size : 49,18 MB
Release : 2001
Category : Computers
ISBN : 9780769511221
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Special Issue on 16th IEEE VLSI Test Symposium (VTS 98)
VLSI Test Symposium
Author : VLSI Test Symposium
Publisher :
Page : pages
File Size : 30,23 MB
Release : 1999
Category :
ISBN :
VLSI Test Symposium (VTS, `98), 16th IEEE.
IEEE, Society Staff
Author : IEEE, Society Staff
Publisher :
Page : pages
File Size : 29,74 MB
Release : 1998
Category :
ISBN :
20th IEEE VLSI Test Symposium (VTS 2002): Without Testing It's a Gamble
IEEE Computer Society Staff
Author : IEEE Computer Society Staff
Publisher :
Page : pages
File Size : 14,12 MB
Release : 2002
Category :
ISBN :
Proceedings
VLSI Test Symposium
Author : VLSI Test Symposium
Publisher : I E E E
Page : 472 pages
File Size : 44,93 MB
Release : 1998
Category : Computers
ISBN : 9780818684364
This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.
Proceedings
Author :
Publisher : IEEE
Page : 452 pages
File Size : 29,24 MB
Release : 2002
Category : Computers
ISBN : 9780769515717