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Author : ASM International
Publisher : ASM International
Page : 551 pages
File Size : 45,17 MB
Release : 2008-01-01
Category : Electronic apparatus and appliances
ISBN : 1615030913
Author : ASM International
Publisher : ASM International(OH)
Page : 528 pages
File Size : 24,93 MB
Release : 2008-01-01
Category : Electronic apparatus and appliances
ISBN : 9780871707147
Author : A. S. M. International
Publisher : ASM International
Page : 561 pages
File Size : 23,2 MB
Release : 2014-11-01
Category : Technology & Engineering
ISBN : 1627080740
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Author :
Publisher :
Page : 528 pages
File Size : 22,87 MB
Release : 2008
Category : Electronic apparatus and appliances
ISBN :
Author : ASM International
Publisher : ASM International
Page : 372 pages
File Size : 37,3 MB
Release : 2007-01-01
Category : Technology & Engineering
ISBN : 1615030905
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
Author : ASM International
Publisher : ASM International(OH)
Page : 356 pages
File Size : 20,41 MB
Release : 2007
Category : Technology & Engineering
ISBN : 9780871708632
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
Author : ASM International
Publisher : ASM International
Page : 534 pages
File Size : 10,56 MB
Release : 2003-01-01
Category : Technology & Engineering
ISBN : 1615030867
Author : ASM International
Publisher : ASM International(OH)
Page : 523 pages
File Size : 40,18 MB
Release : 2005
Category : Science
ISBN : 9780871708236
Author : ASM International
Publisher :
Page : 660 pages
File Size : 23,21 MB
Release : 2017-12
Category :
ISBN : 9781627081504
The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author :
Publisher : ASM International
Page : 371 pages
File Size : 15,69 MB
Release : 2009-01-01
Category : Technology & Engineering
ISBN : 1615030921
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.