[PDF] Testing Packaging Reliability And Applications Of Semiconductor Lasers Iv eBook

Author : Robert Herrick
Publisher : Elsevier
Page : 334 pages
File Size : 45,18 MB
Release : 2021-03-11
Category : Technology & Engineering
ISBN : 0128192542

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Front Cover -- Reliability of Semiconductor Lasers and Optoelectronic Devices -- Copyright Page -- Dedication -- Contents -- List of contributors -- Preface -- Acknowledgments -- 1 Introduction to optoelectronic devices -- 1.1 Introduction -- 1.2 Optoelectronic applications -- 1.2.1 InGaN-based light-emitting diodes for high-efficiency lighting -- 1.2.2 Lasers for sensing arrays -- 1.2.3 Lasers for data- and telecommunications -- 1.2.4 The history of the laser -- 1.3 Principles of operation for optoelectronic components -- 1.3.1 Light emission -- 1.3.1.1 Light emission in gas plasmas: a review -- 1.3.1.2 Stimulated emission in gas lasers -- 1.3.1.3 Spontaneous and stimulated emission from semiconductors -- 1.3.2 Light-emitting diodes -- 1.3.2.1 Carrier confinement -- 1.3.2.2 Light extraction -- 1.3.2.3 Heat extraction -- 1.3.2.4 "Rollover" or "droop" -- 1.3.2.5 "The green gap" -- 1.3.3 Lasers -- 1.3.3.1 What additional design features exist with lasers that are not present with an light-emitting diode? -- Adding a "population inversion" -- Adding waveguiding -- Adding mirrors -- 1.3.3.2 Vertical-cavity surface-emitting lasers -- 1.3.3.3 Direct modulation -- 1.3.4 Modulators -- 1.3.5 Photodetectors -- 1.3.5.1 Photodiodes -- 1.3.5.2 Avalanche photodiodes -- 1.4 Method of fabrication -- 1.4.1 Epitaxial growth -- 1.4.2 Wafer fabrication -- 1.4.3 Wafer test -- 1.4.4 Singulation and packaging -- 1.4.5 Burn-in -- 1.5 Critical metrics -- 1.5.1 Beam divergence -- 1.5.2 Single mode versus multimode -- 1.5.3 Coherence length -- 1.5.4 Power -- 1.5.5 Modulation rate -- 1.6 Laser and light-emitting diode reliability -- 1.6.1 Reliability qualification -- 1.6.2 Quality control -- 1.7 New technology developments -- 1.7.1 Fiber optics -- 1.7.2 The future of optoelectronic devices -- 1.7.2.1 Photonic integrated circuits -- 1.7.2.2 LiDAR.

Author : Xingsheng Liu
Publisher : Springer
Page : 0 pages
File Size : 31,99 MB
Release : 2016-10-01
Category : Technology & Engineering
ISBN : 9781493955909

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This book introduces high power semiconductor laser packaging design. The challenges of the design and various packaging and testing techniques are detailed by the authors. New technologies and current applications are described in detail.

Author : Peter W. Epperlein
Publisher : John Wiley & Sons
Page : 522 pages
File Size : 30,74 MB
Release : 2013-01-25
Category : Technology & Engineering
ISBN : 1118481860

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This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.

Author : Xingsheng Liu
Publisher : Springer
Page : 415 pages
File Size : 30,58 MB
Release : 2014-07-14
Category : Technology & Engineering
ISBN : 1461492637

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This book introduces high power semiconductor laser packaging design. The challenges of the design and various packaging and testing techniques are detailed by the authors. New technologies and current applications are described in detail.

Author : Robert Herrick
Publisher : Woodhead Publishing
Page : 334 pages
File Size : 34,46 MB
Release : 2021-03-06
Category : Technology & Engineering
ISBN : 0128192550

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Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies. This book is suitable for new entrants to the field of optoelectronics working in R&D. • Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry • Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products. • Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more.