[PDF] Testing And Diagnosis Of Analog Circuits And Systems eBook

Author : Ruey-wen Liu
Publisher : Springer Science & Business Media
Page : 290 pages
File Size : 34,54 MB
Release : 2012-12-06
Category : Computers
ISBN : 1461597471

GET BOOK

IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.

Author : Prithviraj Kabisatpathy
Publisher : Springer Science & Business Media
Page : 183 pages
File Size : 42,6 MB
Release : 2006-01-13
Category : Technology & Engineering
ISBN : 0387257438

GET BOOK

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

Author : Yichuang Sun
Publisher : IET
Page : 411 pages
File Size : 15,19 MB
Release : 2008-05-30
Category : Technology & Engineering
ISBN : 0863417450

GET BOOK

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.

Author : Bapiraju Vinnakota
Publisher :
Page : 296 pages
File Size : 39,46 MB
Release : 1998
Category : Technology & Engineering
ISBN :

GET BOOK

More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.

Author : Jose Luis Huertas Díaz
Publisher : Springer Science & Business Media
Page : 310 pages
File Size : 46,71 MB
Release : 2010-02-23
Category : Technology & Engineering
ISBN : 0387235213

GET BOOK

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Author : Marc Pastre
Publisher : Springer Science & Business Media
Page : 284 pages
File Size : 44,7 MB
Release : 2006
Category : Technology & Engineering
ISBN : 9781402042522

GET BOOK

Methodology for the Digital Calibration of Analog Circuits and Systems shows how to relax the extreme design constraints in analog circuits, allowing the realization of high-precision systems even with low-performance components. A complete methodology is proposed, and three applications are detailed. To start with, an in-depth analysis of existing compensation techniques for analog circuit imperfections is carried out. The M/2+M sub-binary digital-to-analog converter is thoroughly studied, and the use of this very low-area circuit in conjunction with a successive approximations algorithm for digital compensation is described. A complete methodology based on this compensation circuit and algorithm is then proposed. The detection and correction of analog circuit imperfections is studied, and a simulation tool allowing the transparent simulation of analog circuits with automatic compensation blocks is introduced. The first application shows how the sub-binary M/2+M structure can be employed as a conventional digital-to-analog converter if two calibration and radix conversion algorithms are implemented. The second application, a SOI 1T DRAM, is then presented. A digital algorithm chooses a suitable reference value that compensates several circuit imperfections together, from the sense amplifier offset to the dispersion of the memory read currents. The third application is the calibration of the sensitivity of a current measurement microsystem based on a Hall magnetic field sensor. Using a variant of the chopper modulation, the spinning current technique, combined with a second modulation of a reference signal, the sensitivity of the complete system is continuously measured without interrupting normal operation. A thermal drift lower than 50 ppm/°C is achieved, which is 6 to 10 times less than in state-of-the-art implementations. Furthermore, the calibration technique also compensates drifts due to mechanical stresses and ageing.

Author : M. Bushnell
Publisher : Springer Science & Business Media
Page : 712 pages
File Size : 27,43 MB
Release : 2004-12-15
Category : Technology & Engineering
ISBN : 0792379918

GET BOOK

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Author : Marvin Onabajo
Publisher : Springer Science & Business Media
Page : 183 pages
File Size : 14,63 MB
Release : 2012-03-08
Category : Technology & Engineering
ISBN : 1461422957

GET BOOK

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters; Includes built-in testing techniques, linked to current industrial trends; Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches; Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.