Author : United States. National Bureau of Standards
Publisher :
Page : 200 pages
File Size : 43,27 MB
Release : 1967
Category :
ISBN :
[PDF] Symposium On Trace Characterization Chemical And Physical Held October 3 7 1966 eBook
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Trace characterization, chemical and physical : based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3 - 7, 1966
Author : Materials Research Symposium
Publisher :
Page : 580 pages
File Size : 14,30 MB
Release : 1967
Category : Chemistry, Analytic
ISBN :
Trace Characterization, Chemical and Physical
Author : W. Wayne Meinke
Publisher :
Page : 608 pages
File Size : 26,49 MB
Release : 1967
Category : Analytical chemistry
ISBN :
A symposium on Trace Characterization, Chemical and Physical was held at the National Bureau of Standards October 3-7, 1966.The volume contains the texts of invited lectures, and summaries by the rapporteurs of the contributed papers and discussion sessions.Topics covered include trace characterization and the properties of materials; electrical measurements; electrochemical methods; optical and x-ray spectroscopy; x-ray diffraction; optical methods; chemical spectrophotometry; nuclear methods; mass spectroscopy; preconcentration; sampling and reagents; and electron and optical microscopy.(Author).
Trace Characterization, Chemical and Physical
Author : W. Wayne Meinke
Publisher :
Page : 602 pages
File Size : 28,99 MB
Release : 1967
Category : Analytical chemistry
ISBN :
A symposium on Trace Characterization, Chemical and Physical was held at the National Bureau of Standards October 3-7, 1966.The volume contains the texts of invited lectures, and summaries by the rapporteurs of the contributed papers and discussion sessions.Topics covered include trace characterization and the properties of materials; electrical measurements; electrochemical methods; optical and x-ray spectroscopy; x-ray diffraction; optical methods; chemical spectrophotometry; nuclear methods; mass spectroscopy; preconcentration; sampling and reagents; and electron and optical microscopy.(Author).
Trace Characterization
Author : W. Wayne Meinke
Publisher :
Page : 608 pages
File Size : 27,77 MB
Release : 1967
Category : Analytical chemistry
ISBN :
NBS Special Publication
Author :
Publisher :
Page : 1014 pages
File Size : 41,7 MB
Release : 1918
Category : Weights and measures
ISBN :
Electronic Density of States
Author : Lawrence Herman Bennett
Publisher :
Page : 840 pages
File Size : 31,67 MB
Release : 1971
Category : Energy-band theory of solids
ISBN :
NBS Monograph
Author :
Publisher :
Page : 598 pages
File Size : 49,42 MB
Release : 1959
Category : Physics
ISBN :
Technical News Bulletin
Author : United States. National Bureau of Standards
Publisher :
Page : 588 pages
File Size : 32,65 MB
Release : 1967
Category : Technology
ISBN :
Dimensions
Author :
Publisher :
Page : 520 pages
File Size : 37,35 MB
Release : 1965
Category : Technology
ISBN :