[PDF] Soft Errors In Modern Electronic Systems eBook

Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
Page : 331 pages
File Size : 47,74 MB
Release : 2010-09-24
Category : Technology & Engineering
ISBN : 1441969934

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This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Author : Jean-Luc Autran
Publisher : CRC Press
Page : 439 pages
File Size : 14,33 MB
Release : 2020-09-30
Category :
ISBN : 9780367655990

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Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment--one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Author : Jean-Luc Autran
Publisher : CRC Press
Page : 432 pages
File Size : 11,74 MB
Release : 2017-12-19
Category : Technology & Engineering
ISBN : 146659084X

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Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Author : Hyungmin Cho
Publisher :
Page : pages
File Size : 24,95 MB
Release : 2015
Category :
ISBN :

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Radiation-induced transient errors (soft errors) are a major reliability concern for digital systems in advanced silicon CMOS technologies. Soft errors create unexpected changes in signal values during system operation, mostly in on-chip memories and flip-flops, resulting in undetected data corruption or expensive downtimes. This dissertation focuses on soft errors in flip-flops because design techniques to protect flip-flops are generally expensive. To protect on-chip memories, coding techniques are routinely used. Error injection simulations are widely used for characterizing system-level effects of soft errors in a given design. These techniques generally inject single-bit errors into randomly-chosen locations (flip-flops, software-visible registers and memories) during randomly-chosen clock cycles. Flip-flop-level error injections suffer from slow Register-Transfer-Level (RTL) simulations. High-level error injections, that inject errors into software-visible registers or memories, are generally fast. Unfortunately, very little literature exists on the accuracies of high-level error injection techniques. We demonstrate that existing high-level error injections can be highly inaccurate by over an order of magnitude, and present detailed error propagation analysis to quantitatively explain the causes of such inaccuracies. For fast, yet accurate, error injection simulations, we present a new mixed-mode simulation platform that combines simulators at two different abstraction levels. This platform achieves 20,000× speedup over RTL-only simulation for an industrial multi-core chip consisting of approximately half-a-billion transistors. This platform targets soft errors in uncore components (e.g., memory subsystem, I/O controllers) that occupy significant portions of the overall chip area. Using this platform, we demonstrate, for the first time, that flip-flop soft errors in uncore components can significantly impact system-level reliability. We also demonstrate that recovery from uncore soft errors can be challenging for traditional system-level checkpointing techniques. A new replay technique overcomes these challenges for uncore components belonging to the memory subsystem.

Author : Selahattin Sayil
Publisher : Springer
Page : 112 pages
File Size : 14,88 MB
Release : 2016-02-25
Category : Technology & Engineering
ISBN : 3319306073

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This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

Author : Rajesh Garg
Publisher : Springer Science & Business Media
Page : 224 pages
File Size : 10,54 MB
Release : 2009-10-22
Category : Technology & Engineering
ISBN : 1441909311

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This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.

Author : Luis Gabriel Bustamante
Publisher :
Page : pages
File Size : 31,53 MB
Release : 2017
Category :
ISBN : 9780355452013

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The progress made in semiconductor technology has pushed transistor dimensions to smaller geometries and higher densities. One of the disadvantages of this progress is that electronic devices have become more sensitive to the effects of radiation-induced soft errors. As current CMOS technology approaches its final practical limits, soft errors are no longer an exclusive problem of space and mission critical applications, but also for many ground-level consumer and commercial applications such as wearables, medical, aviation, automotive, home, and the emerging internet-of-things (IoT) applications which must continue to operate reliably in the presence of higher soft error rates. Over the last decades, researchers have developed techniques to mitigate the effects of soft errors, but as semiconductor technology continues to mature, soft-error mitigation research has gradually redirected its focus from space and mission-critical to terrestrial consumer and commercial applications. The challenges that new applications need to confront are derived from the need to guarantee adequate reliability and performance while at the same time satisfy all production market constrains of area, yield, power, and cost. Most of the techniques to detect, mitigate, and correct soft errors incorporate redundancy in the form of space (hardware), time or a combination of both. Generally, there is not one single perfect solution to solve the soft-error problem and designers must continuously consider the tradeoffs between the cost of hardware redundancy, or the performance degradation of time-added redundancy when selecting a solution. The objective of this research is to develop and evaluate a new hybrid hardware/software technique to detect soft errors. Our technique is based on a time-redundancy approach that performs execution duplication on the same hardware with the goal of saving area, software development while limiting impact on performance. The proposed technique attains execution duplication with the assistance of limited hardware and software overhead that emulates a virtual duplex system similar to that of double modular redundancy hardware solution. A prototype of the hybrid system was implemented on a custom model of a basic 32-bit RISC processor. The hybrid implementation emulates a virtual system duplication by generating small signatures of the processor execution at separate times and detects soft errors when it encounters differences in the execution signatures. The hardware assistance consists of three components. The first is a state signature generation module that compresses the processor execution information. The second part is a signature processing module that detects soft errors when it encounters differences between execution signatures. The third part consists of enhancements to the instruction set that are incorporated into the program to help synchronize the assisting hardware. We then present the results of our implementation of soft-error detection system and discuss its capabilities/drawbacks as well as possible future enhancements. We finally discuss other potential applications of the architecture for approximate computing and IoT applications.