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Achieving System Reliability Growth Through Robust Design and Test

Author : David Nicholls
Publisher : RIAC
Page : 462 pages
File Size : 29,8 MB
Release : 2011-06
Category : Technology & Engineering
ISBN : 1933904356

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Historically, the reliability growth process has been thought of, and treated as, a reactive approach to growing reliability based on failures "discovered" during testing or, most unfortunately, once a system/product has been delivered to a customer. As a result, many reliability growth models are predicated on starting the reliability growth process at test time "zero", with some initial level of reliability (usually in the context of a time-based measure such as Mean Time Between Failure (MTBF)). Time "zero" represents the start of testing, and the initial reliability of the test item is based on its inherent design. The problem with this approach, still predominant today, is that it ignores opportunities to grow reliability during the design of a system or product, i.e., opportunities to go into reliability growth testing with a higher initial inherent reliability at time zero. In addition to the traditional approaches to reliability growth during test, this book explores the activities and opportunities that can be leveraged to promote and achieve reliability growth during the design phase of the overall system life cycle. The ability to do so as part of an integrated, proactive design environment has significant implications for developing and delivering reliable items quickly, on time and within budget. This book offers new definitions of how failures can be characterized, and how those new definitions can be used to develop metrics that will quantify how effective a Design for Reliability (DFR) process is in (1) identifying failure modes and (2) mitigating their root failure causes. Reliability growth can only occur in the presence of both elements.

Reliability Growth

Author : Panel on Reliability Growth Methods for Defense Systems
Publisher : National Academy Press
Page : 235 pages
File Size : 34,34 MB
Release : 2015-03-01
Category : Technology & Engineering
ISBN : 9780309314749

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A high percentage of defense systems fail to meet their reliability requirements. This is a serious problem for the U.S. Department of Defense (DOD), as well as the nation. Those systems are not only less likely to successfully carry out their intended missions, but they also could endanger the lives of the operators. Furthermore, reliability failures discovered after deployment can result in costly and strategic delays and the need for expensive redesign, which often limits the tactical situations in which the system can be used. Finally, systems that fail to meet their reliability requirements are much more likely to need additional scheduled and unscheduled maintenance and to need more spare parts and possibly replacement systems, all of which can substantially increase the life-cycle costs of a system. Beginning in 2008, DOD undertook a concerted effort to raise the priority of reliability through greater use of design for reliability techniques, reliability growth testing, and formal reliability growth modeling, by both the contractors and DOD units. To this end, handbooks, guidances, and formal memoranda were revised or newly issued to reduce the frequency of reliability deficiencies for defense systems in operational testing and the effects of those deficiencies. "Reliability Growth" evaluates these recent changes and, more generally, assesses how current DOD principles and practices could be modified to increase the likelihood that defense systems will satisfy their reliability requirements. This report examines changes to the reliability requirements for proposed systems; defines modern design and testing for reliability; discusses the contractor's role in reliability testing; and summarizes the current state of formal reliability growth modeling. The recommendations of "Reliability Growth" will improve the reliability of defense systems and protect the health of the valuable personnel who operate them.

Robustness Development and Reliability Growth

Author : John P. King
Publisher : Pearson Education
Page : 934 pages
File Size : 15,99 MB
Release : 2010-03-25
Category : Technology & Engineering
ISBN : 0137079222

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This book integrates key tools and processes into a comprehensive program for developing more robust and reliable technology-based products. Drawing on their extensive product development experience, the authors present a complete process for ensuring product performance throughout the entire lifecycle, from understanding customers’ needs through manufacturing and post-launch support. The authors begin by presenting broad insights and high-level strategies for improving product quality. Next, they demonstrate how to implement robustness and reliability strategies that complement existing governance and decision processes. A section on tools and methods shows how to institutionalize best practices and apply them consistently. Finally, they tie strategies, decisions, and methods together through a case study project. Product developers will learn how to Understand critical drivers of value in technology products, including reliability and durability Implement a process model and roadmap for improving reliability and robustness Increase robustness early in development, leading to shorter cycle times in later phases Improve the stability of production performance under stress conditions Assess both organizational and process capabilities for delivering robust and reliable products Understand and manage customer-driven requirements Use tools including descriptive and inferential statistics and DOE-based empirical models Managers will understand expectations for Design concepts supported by rigorous analyses of alternatives Products and processes delivering higher value to customers Products with higher reliability and longer useful lives Product processes with lower costs and higher capabilities Development projects having shorter, more predictable cycle times Readers are introduced to many thought leaders whose writings can be sources of further learning. This book is a valuable resource for anyone responsible for delivering reliable, profitable technology products, including general managers, program managers, engineers, scientists, and reliability and quality professionals.

NASA SP-7500

Author : United States. National Aeronautics and Space Administration
Publisher :
Page : 180 pages
File Size : 14,36 MB
Release : 1980
Category :
ISBN :

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Recent Advances in Life-Testing and Reliability

Author : N. Balakrishnan
Publisher : CRC Press
Page : 662 pages
File Size : 49,91 MB
Release : 2023-07-21
Category : Mathematics
ISBN : 1000948390

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This unique volume presents chapters written on the areas of life-testing and reliability by many well-known researchers who have contributed significantly to these two areas over the years. Chapters cover a wide range of topics such as inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, accelerated testing, and more. The book is written in an easy-to-follow style, first presenting the necessary theoretical details and then illustrating the methods with a numerical examples wherever possible. Many tables and graphs that are essential for the use of some of the new methodologies are presented throughout the volume. Numerous examples provide the reader with a clear understanding of the methods presented as well as with insight into the applications of these results.

Author :
Publisher : Elsevier
Page : 3685 pages
File Size : 37,87 MB
Release :
Category :
ISBN : 0080962319

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Software Engineering and Testing

Author : B. B. Agarwal
Publisher : Jones & Bartlett Learning
Page : 534 pages
File Size : 21,97 MB
Release : 2010
Category : Computers
ISBN : 9781934015551

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This book is designed for use as an introductory software engineering course or as a reference for programmers. Up-to-date text uses both theory applications to design reliable, error-free software. Includes a companion CD-ROM with source code third-party software engineering applications.

Applied Life Data Analysis

Author : Wayne B. Nelson
Publisher : John Wiley & Sons
Page : 666 pages
File Size : 34,15 MB
Release : 2003-12-22
Category : Technology & Engineering
ISBN : 9780471644620

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WILEY-INTERSCIENCE PAPERBACK SERIES The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "Many examples drawn from the author’s experience of engineering applications are used to illustrate the theoretical results, which are presented in a cookbook fashion...it provides an excellent practical guide to the analysis of product-life data." –T.M.M. Farley Special Programme of Research in Human Reproduction World Health Organization Geneva, Switzerland Review in Biometrics, September 1983 Now a classic, Applied Life Data Analysis has been widely used by thousands of engineers and industrial statisticians to obtain information from life data on consumer, industrial, and military products. Organized to serve practitioners, this book starts with basic models and simple informative probability plots of life data. Then it progresses through advanced analytical methods, including maximum likelihood fitting of advanced models to life data. All data analysis methods are illustrated with numerous clients' applications from the author's consulting experience.