[PDF] Proceedings Of The Eight Annual Conference On Applications Of X Ray Analysis eBook

Author : William M. Mueller
Publisher : Springer
Page : 564 pages
File Size : 13,27 MB
Release : 2012-10-08
Category : Science
ISBN : 9781468476071

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The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of the presentations are confirmations of the observation that the field of X-ray re search is indeed in a state of rapid and healthy development. Financial assistance provided by the United States Office of Naval Research permitted the participation oftwo distinguished scientists from Europe, Professor Andre Guinier of the University of Paris and Professor Hans Nowotny of the University of Vienna.

Author : William M. Mueller
Publisher : Springer
Page : 376 pages
File Size : 45,37 MB
Release : 1995-12-31
Category : Science
ISBN : 9780306381034

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It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.

Author : Burton Henke
Publisher : Springer
Page : 682 pages
File Size : 30,58 MB
Release : 1970-05-01
Category : Science
ISBN : 9780306381133

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This conference has attempted to achieve a balance in the presentation of papers on the application of current methods to established problem areas and on the introduction of new methods and applications. It has recognized the relevance of papers on basic physics and chemistry and on the total interaction of x-r~s with matter. In order to achieve sufficient depth, a topic is chosen each year for special emphasis. This conference had as its central theme, "The Interactions and Applications of Low Energy X-R~s." Those who were invited as speakers and as contributors to this volume are among the outstanding workers in the application of low energy x-ray and the associated photo-Auger electron interactions. These include A. K. Baird and W. L. Baun on Light Element Analysis and Long Wavelength Instrumentation; J. E. Hollid~, D. W. Fischer, R. J. Liefeld and D. J. Nagel on Bonding and Valence State; H. Friedman and W. P. Reidy on X-R~ Astronomy; and R. Nordberg on Photo-Auger Electron Spectroscopy. Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy. It has been most appropriate and indeed a privilege to have Dr. Herbert Friedman as a speaker and contributor to this volume.

Author : William M. Mueller
Publisher :
Page : 386 pages
File Size : 48,36 MB
Release : 2012-05-01
Category :
ISBN : 9781258351854

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Contributing Authors Are Paul Lublin, Charles G. Dodd, P. William Zingaro, And Many Others.