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Optical Metrology with Interferometry

Author : Dahi Ghareab Abdelsalam Ibrahim
Publisher : Cambridge Scholars Publishing
Page : 312 pages
File Size : 42,23 MB
Release : 2019-07-31
Category : Technology & Engineering
ISBN : 1527537730

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The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In combination with computers and other electronic devices, optical interferometry has become faster, more reliable, more convenient and more robust. There is now a wealth of new optical interferometry techniques on the market, or being developed in academia, that can measure surface topography with high precision. Each method has both its strong points and its limitations. This book explains in detail the basics of optical interferometry, their common language, generic features and limitations, and their simulation and uncertainties. Moreover, it provides an introduction to new frontiers in optical interferometry, including terahertz technology and optical frequency combs.

RGB Interferometry for Optical Metrology

Author : Paul Kumar Upputuri
Publisher :
Page : 51 pages
File Size : 17,47 MB
Release : 2019
Category : Interferometry
ISBN : 9781510634374

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This Spotlight discusses the theoretical and experimental aspects of RGB interferometry. It also focuses on various advanced RGB interferometers and their applications for 3-D surface profiling, deformation measurements, non-destructive testing (NDT), refractive index profiling of biological cells/tissues, etc. RGB interferometry is a fast, simple, and cost-effective tool for optical metrology and imaging applications.

Introduction to Optical Metrology

Author : Rajpal S. Sirohi
Publisher : CRC Press
Page : 449 pages
File Size : 17,40 MB
Release : 2017-07-12
Category : Technology & Engineering
ISBN : 1482236117

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Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.

Optical Metrology

Author : Kjell J. Gåsvik
Publisher : John Wiley & Sons
Page : 372 pages
File Size : 14,11 MB
Release : 2003-04-11
Category : Technology & Engineering
ISBN : 0470846704

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New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.

Optical Metrology

Author : Olivério D.D. Soares
Publisher : Springer Science & Business Media
Page : 794 pages
File Size : 47,68 MB
Release : 2012-12-06
Category : Science
ISBN : 9400936095

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Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quality control, non-destructive tes ting and in fundamental research. In order to define the state-of-the-art, and to evaluate pre sent accomplishments, whilst giving an appraisal of how each of the particular topics will evolve the Optical Metrology-anAdvancedStudy Institute was organized with a concourse of the world's acknowledged experts. Thus, the Institute provided a forum for tutorial reviews blended with topics of current research in the form of a progressive and comprehensive presentation of recent promising developments, lea ding techniques and instrumentation in incoherent and coherent optics for Metrology, Sensing and Control in Science, Industry and Biomedici ne. Optical Metrology is a very broad field which is highly inter disciplinary in its applications, and in its scientific and technolo gical background. It is related to such diverse disciplines as physi cal and chemical sciences, engineering, electronics, computer scien ces, biological sciences and theoretical sciences, such as statistics. Although there was an emphasis on photomechanics and industri al applications, a marked diversity was reflected in the different background and interests of the participants. The vitality and viabi lity of the discipline was enhanced not only by the encouraging number of young scientists and industrialists participating and authoring, but also by the remarkably promising prospects found in x the practical applications supported by advanced electronic hybridi zation.

Fringe Pattern Analysis for Optical Metrology

Author : Manuel Servin
Publisher : John Wiley & Sons
Page : 344 pages
File Size : 26,43 MB
Release : 2014-08-18
Category : Technology & Engineering
ISBN : 3527411526

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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Optical Measurement of Surface Topography

Author : Richard Leach
Publisher : Springer Science & Business Media
Page : 333 pages
File Size : 32,89 MB
Release : 2011-03-31
Category : Technology & Engineering
ISBN : 3642120121

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The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

Handbook of Optical Metrology

Author : Toru Yoshizawa
Publisher : CRC Press
Page : 744 pages
File Size : 48,53 MB
Release : 2017-07-28
Category : Technology & Engineering
ISBN : 1351831844

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Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

Optical Interferometry, 2e

Author : P. Hariharan
Publisher : Academic Press
Page : 369 pages
File Size : 14,65 MB
Release : 2003-09-22
Category : Science
ISBN : 0123116309

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Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.

Optical Interferometry

Author : Alexandr Banishev
Publisher : BoD – Books on Demand
Page : 262 pages
File Size : 35,66 MB
Release : 2017-02-15
Category : Technology & Engineering
ISBN : 9535129554

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Optical methods of measurements are the most sensitive techniques of noncontact investigations, and at the same time, they are fast as well as accurate which increases reproducibility of observed results. In recent years, the importance of optical interferometry methods for research has dramatically increased, and applications range from precise surface testing to finding extrasolar planets. This book covers various aspects of optical interferometry including descriptions of novel apparatuses and methods, application interferometry for studying biological objects, surface qualities, materials characterization, and optical testing. The book includes a series of chapters in which experts share recent progress in interferometry through original research and literature reviews.