[PDF] Optical Measurements Modeling And Metrology Volume 5 eBook

Author : Tom Proulx
Publisher : Springer Science & Business Media
Page : 412 pages
File Size : 17,66 MB
Release : 2011-05-27
Category : Technology & Engineering
ISBN : 146140228X

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Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; MEMS and Nanotechnology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.

Author : Bernd D¿rband
Publisher : John Wiley & Sons
Page : 1005 pages
File Size : 10,14 MB
Release : 2012-05-14
Category : Science
ISBN : 3527403817

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The state-of-the-art full-colored handbook gives a comprehensive introduction to the principles and the practice of calculation, layout, and understanding of optical systems and lens design. Written by reputed industrial experts in the field, this text introduces the user to the basic properties of optical systems, aberration theory, classification and characterization of systems, advanced simulation models, measuring of system quality and manufacturing issues. In this Volume Volume 5 topics comprise the methods of measuring the properties of optical systems. The different fundamental techniques, such as propagation measurement and polarimetry, are introduced and discussed in detail and clarity. The presentation allows the reader, after having devised an optical system, to perform the measurements best suited to ascertain that the system fulfills the specific needs and requirements. The following chapters provide a survey on materials, coatings and surfaces of optical components, and combine this with a treatment of light and radiation. The book thus serves as a one-stop reference for metrology of optical systems. Other Volumes Volume 1: Fundamentals of Technical Optics Volume 2: Physical Image Formation Volume 3: Aberration Theory and Correction of Optical Systems Volume 4: Survey of Optical Instruments

Author : Pierre Deymier
Publisher : Springer
Page : 305 pages
File Size : 34,6 MB
Release : 2015-11-25
Category : Science
ISBN : 3319245295

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This book presents cutting-edge concepts, paradigms, and research highlights in the field of computational materials science and engineering, and provides a fresh, up-to-date perspective on solving present and future materials challenges. The chapters are written by not only pioneers in the fields of computational materials chemistry and materials science, but also experts in multi-scale modeling and simulation as applied to materials engineering. Pedagogical introductions to the different topics and continuity between the chapters are provided to ensure the appeal to a broad audience and to address the applicability of integrated computational materials science and engineering for solving real-world problems.

Author : Toru Yoshizawa
Publisher : CRC Press
Page : 744 pages
File Size : 20,65 MB
Release : 2017-07-28
Category : Technology & Engineering
ISBN : 1351831844

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Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

Author : Nancy Sottos
Publisher : Springer
Page : 202 pages
File Size : 29,58 MB
Release : 2014-08-02
Category : Science
ISBN : 3319069896

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Experimental and Applied Mechanics, Volume 6: Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics, the sixth volume of eight from the Conference, brings together contributions to important areas of research and engineering. The collection presents early findings and case studies on a wide range of topics, including: Advances in Residual Stress Measurement Methods Residual Stress Effects on Material Performance Inverse Problems and Hybrid Techniques Thermoelastic Stress Analysis Infrared Techniques Research in Progress Applications in Experimental Mechanics

Author : Kevin Harding
Publisher : Taylor & Francis
Page : 497 pages
File Size : 48,42 MB
Release : 2016-04-19
Category : Science
ISBN : 1439854823

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Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods

Author : Kjell J. Gåsvik
Publisher : John Wiley & Sons
Page : 372 pages
File Size : 32,9 MB
Release : 2003-04-11
Category : Technology & Engineering
ISBN : 0470846704

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New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.

Author : Abraham Landzberg
Publisher : Springer Science & Business Media
Page : 663 pages
File Size : 24,39 MB
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 1461520290

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The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.

Author : Zinoviy Nazarchuk
Publisher : Springer Nature
Page : 415 pages
File Size : 12,36 MB
Release : 2023-05-23
Category : Science
ISBN : 9819912261

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This book includes the description, modeling and realization of new optical metrology techniques for technical diagnostics of materials. Special attention is paid to multi-step phase shifting interferometry with arbitrary phase shifts between interferograms, phase shifting and correlation digital speckle pattern interferometry, optical-digital speckle correlation, and digital image correlation, as well as dynamic speckle patterns analysis. Optoacoustic techniques can be treated as a separate branch of optical metrology and can solve many problems of technical diagnostics, including detection and localization of subsurface defects in laminated composite materials. The utility of such techniques can be increased by illumination of the object via acoustic waves at certain frequencies. Hence, an effective theoretical approach to the modeling of an elastic wave field interaction with an interphase defect, and to defect visualization using dynamic speckle patterns, is also included in this book. The experimental proof of the proposed approaches was achieved using a specially created hybrid optical-digital system for detection of different subsurface defects. This book is intended for engineers, researchers and students engaged in the field of nondestructive evaluation of materials and technical diagnostics of structural elements, hybrid optical systems, speckle metrology and optoacoustic imaging techniques.