[PDF] Nanometer Variation Tolerant Sram eBook

Author : Mohamed Abu Rahma
Publisher : Springer Science & Business Media
Page : 176 pages
File Size : 18,21 MB
Release : 2012-09-27
Category : Technology & Engineering
ISBN : 1461417481

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Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.

Author : Mohamed Abu Rahma
Publisher : Springer Science & Business Media
Page : 176 pages
File Size : 28,87 MB
Release : 2012-09-26
Category : Technology & Engineering
ISBN : 146141749X

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Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.

Author : Swarup Bhunia
Publisher : Springer Science & Business Media
Page : 444 pages
File Size : 30,19 MB
Release : 2010-11-10
Category : Technology & Engineering
ISBN : 1441974180

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Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

Author : Mohamed Hassan Abu-Rahma
Publisher :
Page : 156 pages
File Size : 21,99 MB
Release : 2008
Category :
ISBN :

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Aggressive scaling of CMOS technology in sub-90nm nodes has created huge challenges. Variations due to fundamental physical limits, such as random dopants fluctuation (RDF) and line edge roughness (LER) are increasing significantly with technology scaling. In addition, manufacturing tolerances in process technology are not scaling at the same pace as transistor's channel length due to process control limitations (e.g., sub-wavelength lithography). Therefore, within-die process variations worsen with successive technology generations. These variations have a strong impact on the maximum clock frequency and leakage power for any digital circuit, and can also result in functional yield losses in variation-sensitive digital circuits (such as SRAM). Moreover, in nanometer technologies, digital circuits show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost while achieving higher performance and density. It is therefore not surprising that the International Technology Roadmap for Semiconductors (ITRS) lists variability as one of the most challenging obstacles for IC design in nanometer regime. To facilitate variation-tolerant design, we study the impact of random variations on the delay variability of a logic gate and derive simple and scalable statistical models to evaluate delay variations in the presence of within-die variations. This work provides new design insight and highlights the importance of accounting for the effect of input slew on delay variations, especially at lower supply voltages.

Author : Jaume Anguera
Publisher : Springer
Page : 892 pages
File Size : 10,29 MB
Release : 2018-01-25
Category : Technology & Engineering
ISBN : 9811073295

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The volume contains 94 best selected research papers presented at the Third International Conference on Micro Electronics, Electromagnetics and Telecommunications (ICMEET 2017) The conference was held during 09-10, September, 2017 at Department of Electronics and Communication Engineering, BVRIT Hyderabad College of Engineering for Women, Hyderabad, Telangana, India. The volume includes original and application based research papers on microelectronics, electromagnetics, telecommunications, wireless communications, signal/speech/video processing and embedded systems.

Author : Vikrant Bhateja
Publisher : Springer Nature
Page : 634 pages
File Size : 46,87 MB
Release : 2022-10-27
Category : Technology & Engineering
ISBN : 9811949905

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This book highlights a collection of high-quality peer-reviewed research papers presented at the 7th International Conference on Information System Design and Intelligent Applications (INDIA 2022), held at BVRIT Hyderabad College of Engineering for Women, Hyderabad, Telangana, India, from February 25–26, 2022. It covers a wide range of topics in computer science and information technology, from wireless networks, social networks, wireless sensor networks, information and network security, to web security, Internet of Things, bioinformatics, geoinformatics, and computer networks.

Author : Brajesh Kumar Kaushik
Publisher : Springer
Page : 820 pages
File Size : 13,25 MB
Release : 2017-12-21
Category : Computers
ISBN : 9811074704

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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Author : Shekhar Verma
Publisher : Springer
Page : 661 pages
File Size : 42,93 MB
Release : 2018-10-10
Category : Computers
ISBN : 9811323720

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This book (CCIS 839) constitutes the refereed proceedings of the First International Conference on Communication, Networks and Computings, CNC 2018, held in Gwalior, India, in March 2018. The 70 full papers were carefully reviewed and selected from 182 submissions. The papers are organized in topical sections on wired and wireless communication systems, high dimensional data representation and processing, networks and information security, computing techniques for efficient networks design, electronic circuits for communication system.