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Modulation Transfer Function in Optical and Electro-optical Systems

Author : Glenn D. Boreman
Publisher : SPIE Press
Page : 124 pages
File Size : 33,70 MB
Release : 2001
Category : Science
ISBN : 9780819441430

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This tutorial introduces the theory and applications of MTF, used to specify the image quality achieved by an imaging system. It covers basic linear systems theory and the relationship between impulse response, resolution, MTF, OTF, PTF, and CTF. Practical measurement and testing issues are discussed.

Introduction to the Optical Transfer Function

Author : Charles Sumner Williams
Publisher : SPIE Press
Page : 436 pages
File Size : 11,37 MB
Release : 2002
Category : Science
ISBN : 9780819443366

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This work covers spatial frequency, spread function, wave aberration, and transfer function - and how these concepts are related in an optical system, how they are measured and calculated, and how they may be useful.

A System Engineering Approach to Imaging

Author : Norman S. Kopeika
Publisher : SPIE Press
Page : 710 pages
File Size : 20,58 MB
Release : 1998
Category : Science
ISBN : 9780819423771

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This textbook addresses imaging from the system engineering point of view, examining advantages and disadvantages of imaging in various spectral regions. Focuses on imaging principles and system concepts, rather than devices. Intended as a senior-year undergraduate or graduate level engineering textbook. A solution manual is included.

Introduction to the Optical Transfer Function

Author : Charles S. Williams
Publisher :
Page : 440 pages
File Size : 15,81 MB
Release : 1989-02-20
Category : Science
ISBN :

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This timely publication brings together, in one source, a wealth of information on the optical transfer function. Treats fundamental concepts of spatial frequency, the spread function, wave aberration, and the transfer function. Then relates them to optical systems, including discussion of how they are measured and calculated, and their uses. Treatment is practical, and includes many illustrations.

Fringe 2005

Author : Wolfgang Osten
Publisher : Springer Science & Business Media
Page : 729 pages
File Size : 41,90 MB
Release : 2006-01-26
Category : Technology & Engineering
ISBN : 3540293035

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In 1989 the time was hot to create a workshop series dedicated to the dicussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial applications of optical metrology. However, such a workshop must take place in a dynamic environment. The- fore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 new prin- ples of optical shape measurement, setup calibration, phase unwr- ping and nondestructive testing were the focus of discussion, while in 1997 new approaches in multi-sensor metrology, active measu- ment strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was dedicated to - tical methods for micromeasurements, hybrid measurement te- nologies and new sensor solutions for industrial inspection. The fifth workshop takes place in Stuttgart, the capital of the state of Baden- Württemberg and the centre of a region with a long and remarkable tradition in engineering. Thus after Berlin 1989, Bremen 1993, 1997 and 2001, Stuttgart is the third Fringe city where international - perts will meet each other to share new ideas and concepts in optical metrology. This volume contains the papers presented during FRINGE 2005.

Electron Nano-Imaging

Author : Nobuo Tanaka
Publisher : Springer
Page : 340 pages
File Size : 47,31 MB
Release : 2017-04-04
Category : Technology & Engineering
ISBN : 4431565027

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In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

Wavefront Optics for Vision Correction

Author : Guang-ming Dai
Publisher : SPIE Press
Page : 367 pages
File Size : 15,71 MB
Release : 2008
Category : Ophthalmology
ISBN : 0819469661

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This book addresses some of the issues in visual optics with a functional analysis of ocular aberrations, especially for the purpose of vision correction. The basis is the analytical representation of ocular aberrations with a set of orthonormal polynomials, such as Zernike polynomials or the Fourier series. Although the aim of this book is the application of wavefront optics to laser vision correction, most of the theories discussed are equally applicable to other methods of vision correction, such as contact lenses and intraocular lenses.

FRCR Physics Notes

Author : Christopher Clarke
Publisher :
Page : 320 pages
File Size : 48,28 MB
Release : 2020-11-13
Category :
ISBN : 9781999988524

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Comprehensive medical imaging physics notes aimed at those sitting the first FRCR physics exam in the UK and covering the scope of the Royal College of Radiologists syllabus. Written by Radiologists, the notes are concise and clearly organised with 100's of beautiful diagrams to aid understanding. The notes cover all of radiology physics, including basic science, x-ray imaging, CT, ultrasound, MRI, molecular imaging, and radiation dosimetry, protection and legislation. Although aimed at UK radiology trainees, it is also suitable for international residents taking similar examinations, postgraduate medical physics students and radiographers. The notes provide an excellent overview for anyone interested in the physics of radiology or just refreshing their knowledge. This third edition includes updates to reflect new legislation and many new illustrations, added sections, and removal of content no longer relevent to the FRCR physics exam. This edition has gone through strict critique and evaluation by physicists and other specialists to provide an accurate, understandable and up-to-date resource. The book summarises and pulls together content from the FRCR Physics Notes at Radiology Cafe and delivers it as a paperback or eBook for you to keep and read anytime. There are 7 main chapters, which are further subdivided into 60 sub-chapters so topics are easy to find. There is a comprehensive appendix and index at the back of the book.