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Author : Electronic Device Failure Analysis Society
Publisher : ASM International
Page : 524 pages
File Size : 15,65 MB
Release : 2006
Category : Technology & Engineering
ISBN : 1615030891
Author : ASM International
Publisher : ASM International
Page : 524 pages
File Size : 34,44 MB
Release : 2005-01-01
Category : Technology & Engineering
ISBN : 1615030883
Author : ASM International
Publisher : ASM International
Page : 372 pages
File Size : 35,63 MB
Release : 2007-01-01
Category : Technology & Engineering
ISBN : 1615030905
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
Author : ASM International
Publisher : ASM International
Page : 551 pages
File Size : 41,48 MB
Release : 2008-01-01
Category : Electronic apparatus and appliances
ISBN : 1615030913
Author : ASM International
Publisher :
Page : 524 pages
File Size : 12,70 MB
Release : 2006
Category : Technology & Engineering
ISBN : 9781615030897
Author :
Publisher :
Page : 542 pages
File Size : 50,25 MB
Release : 2006
Category : Electronic book
ISBN :
Author : A. S. M. International
Publisher : ASM International
Page : 634 pages
File Size : 43,67 MB
Release : 2013-01-01
Category : Technology & Engineering
ISBN : 1627080228
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
Author : A. S. M. International
Publisher : ASM International
Page : 561 pages
File Size : 16,3 MB
Release : 2014-11-01
Category : Technology & Engineering
ISBN : 1627080740
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Author :
Publisher : ASM International
Page : 371 pages
File Size : 19,41 MB
Release : 2009-01-01
Category : Technology & Engineering
ISBN : 1615030921
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Author : ASM International
Publisher : ASM International
Page : 643 pages
File Size : 45,5 MB
Release : 2012
Category : Technology & Engineering
ISBN : 1615039953