[PDF] Ion Beam Techniques And Applications eBook

Author : Ishaq Ahmad
Publisher : BoD – Books on Demand
Page : 115 pages
File Size : 50,83 MB
Release : 2020-06-10
Category : Technology & Engineering
ISBN : 178984570X

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A wide variety of ion beam techniques are being used in several versatile applications ranging from environmental science, nuclear physics, microdevice fabrication to materials science. In addition, new applications of ion beam techniques across a broad range of disciplines and fields are also being discovered frequently. In this book, the latest research and development on progress in ion beam techniques has been compiled and an overview of ion beam irradiation-induced applications in nanomaterial-focused ion beam applications, ion beam analysis techniques, as well as ion implantation application in cells is provided. Moreover, simulations of ion beam-induced damage to structural materials of nuclear fusion reactors are also presented in this book.

Author : Lucille A. Giannuzzi
Publisher : Springer Science & Business Media
Page : 362 pages
File Size : 37,1 MB
Release : 2006-05-18
Category : Science
ISBN : 038723313X

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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Author : Michael Nastasi
Publisher : CRC Press
Page : 476 pages
File Size : 11,63 MB
Release : 2014-08-27
Category : Science
ISBN : 1439846383

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Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. The book explains how ions interact with solids and describes what information can be gained. It starts by covering the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induced x-ray emission, and nuclear reaction analysis. The second part turns to applications, looking at the broad range of potential uses in thin film reactions, ion implantation, nuclear energy, biology, and art/archaeology. Examines classical collision theory Details the fundamentals of five specific ion beam analysis techniques Illustrates specific applications, including biomedicine and thin film analysis Provides examples of ion beam analysis in traditional and emerging research fields Supplying readers with the means to understand the benefits and limitations of IBA, the book offers practical information that users can immediately apply to their own work. It covers the broad range of current and emerging applications in materials science, physics, art, archaeology, and biology. It also includes a chapter on computer applications of IBA.

Author : Ishaq Ahmad
Publisher : BoD – Books on Demand
Page : 190 pages
File Size : 40,59 MB
Release : 2018-07-18
Category : Science
ISBN : 178923414X

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Ion beam of various energies is a standard research tool in many areas of science, from basic physics to diverse areas in space science and technology, device fabrications, materials science, environment science, and medical sciences. It is an advance and versatile tool to frequently discover applications across a broad range of disciplines and fields. Moreover, scientists are continuously improving the ion beam sources and accelerators to explore ion beam at the forefront of scientific endeavours. This book provides a glance view on MeV ion beam applications, focused ion beam generation and its applications as well as practical applications of ion implantation.

Author : Michael Nastasi
Publisher : CRC Press
Page : 460 pages
File Size : 46,52 MB
Release : 2014-08-27
Category : Science
ISBN : 1439846391

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Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization.The book explains how ions interact with solids

Author : J. R. Bird
Publisher : Academic Press
Page : 748 pages
File Size : 33,10 MB
Release : 1989
Category : Science
ISBN :

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The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

Author : Jon Orloff
Publisher : Springer Science & Business Media
Page : 304 pages
File Size : 24,8 MB
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 1461507650

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In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject.

Author : A.G. Balogh
Publisher : Trans Tech Publications Ltd
Page : 512 pages
File Size : 50,46 MB
Release : 1997-05-29
Category : Technology & Engineering
ISBN : 3035705208

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The first particle accelerators were built in the early 1930’s. For a long time, these devices were used exclusively by nuclear physicists. In the 1960’s, extensive developments in measuring techniques occurred, mainly as a result of newly developed semiconductor devices. Further strong interest arose from the semiconductor industry, and ion implantation became widely accepted as being the ultimate tool for Si-based device fabrication.

Author : Michael Nastasi
Publisher : Cambridge University Press
Page : 572 pages
File Size : 34,52 MB
Release : 1996-03-29
Category : Science
ISBN : 052137376X

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Comprehensive guide to an important materials science technique for students and researchers.

Author : Ute Linz
Publisher : Springer Science & Business Media
Page : 728 pages
File Size : 25,99 MB
Release : 2011-12-09
Category : Science
ISBN : 3642214142

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The book provides a detailed, up-to-date account of the basics, the technology, and the clinical use of ion beams for radiation therapy. Theoretical background, technical components, and patient treatment schemes are delineated by the leading experts that helped to develop this field from a research niche to its current highly sophisticated and powerful clinical treatment level used to the benefit of cancer patients worldwide. Rather than being a side-by-side collection of articles, this book consists of related chapters. It is a common achievement by 76 experts from around the world. Their expertise reflects the diversity of the field with radiation therapy, medical and accelerator physics, radiobiology, computer science, engineering, and health economics. The book addresses a similarly broad audience ranging from professionals that need to know more about this novel treatment modality or consider to enter the field of ion beam therapy as a researcher. However, it is also written for the interested public and for patients who might want to learn about this treatment option.