[PDF] In Circuit Testing eBook

Author : John T. Bateson
Publisher : Springer Science & Business Media
Page : 197 pages
File Size : 50,22 MB
Release : 2012-12-06
Category : Science
ISBN : 9401170096

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The aim of this text is to increase your understanding of the methods employed for improving the quality of printed circuit boards (PCBs) in a practical manufacturing environment, by discussing printed circuit board faults and the test strategies implemented to detect these faults. This text emphasizes in-circuit testing as a prime test and diagnostic technique. Test strategies are described - implementing functional board testers, in-circuit board testers, in-circuit analyzers, and loaded board shorts testers. Also discussed are in-circuit tester's hardware, software, fix turing, and programming. Specific attention has been given to the in-circuit tester's capabilities and limitations, features and benefits, advantages and disadvantages. Chapter 5, as part of the total production testing process, discusses rework stations, network ing, and test area management. Chapter 8 is devoted to discussing the benefits derived by employing in-circuit testing in the service repair arena. This text concludes with chapters on vendor investiga tion and a financial justification. Additional emphasis is placed on having design engineering acquire an interest in manufacturability, testability, and the importance of consulting with manufacturing early in the design process. This book is designed for ease of reading and comprehension for all levels of interest: ATE students, fust-time ATE users, as well as those involved in test, manufacturing, quality control or assurance, production, engineering, and management.

Author : Allen Buckroyd
Publisher : Butterworth-Heinemann
Page : 183 pages
File Size : 29,71 MB
Release : 2015-07-14
Category : Technology & Engineering
ISBN : 1483144496

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In-Circuit Testing discusses what an in-circuit test (ICT) is and what it can and cannot do. It answers many questions on how tests are actually carried out, with the benefits and drawbacks of the techniques. The emphasis throughout is towards practical problem solving, and many of the examples used are of surface mount printed circuit boards (PCBs). The book contains separate chapters on application—fitting ICT into a typical test strategy and into the manufacturing environment. The buying decision is fully explored—choice of system, initial and ongoing costs, and preparation of the financial proposal to Management. Then, assuming the automatic test equipment (ATE) has been purchased, additional chapters are devoted to: programming problems and solutions, interfacing problems and solutions, fault diagnosis and fault finding tools. Design for in-circuit test also merits a chapter. This covers specific design guides and the constraints which need to be placed on designers to ensure that ICT is cost effective. The concluding chapter reviews the purchase and use of the chosen ICT with the benefit of hindsight; it covers cost effectiveness; looks at alternative methods of testing, programming, and interfacing; and alternative ways of costing the testing service. This book is written for potential purchasers and users of in-circuit automatic testers who are attracted to the concept of ICT, but who may need help. This includes Test Engineering Managers who need guidance on which equipment to buy for a given application (and how to financially justify the purchase), and ATE Programmers, Test Engineers and Technicians who would welcome practical advice on how best to use the chosen ATE.

Author : Allen Buckroyd
Publisher :
Page : 168 pages
File Size : 37,4 MB
Release : 1994
Category : Printed circuits
ISBN : 9780750609302

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In-Circuit Testing discusses what an in-circuit test (ICT) is and what it can and cannot do. It answers many questions on how tests are actually carried out, with the benefits and drawbacks of the techniques. The emphasis throughout is towards practical problem solving, and many of the examples used are of surface mount printed circuit boards (PCBs). The book contains separate chapters on application-fitting ICT into a typical test strategy and into the manufacturing environment. The buying decision is fully explored-choice of system, initial and ongoing costs, and preparation of the financial...

Author : Ian A. Grout
Publisher : Springer Science & Business Media
Page : 396 pages
File Size : 39,68 MB
Release : 2005-08-22
Category : Technology & Engineering
ISBN : 9781846280238

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Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively

Author : Francis C. Wong
Publisher : Elsevier
Page : 248 pages
File Size : 41,28 MB
Release : 2012-12-02
Category : Technology & Engineering
ISBN : 0080504345

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Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Author : Stanley Leonard Hurst
Publisher : IET
Page : 560 pages
File Size : 23,31 MB
Release : 1998
Category : Computers
ISBN : 9780852969014

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Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR

Author : Raymond Kimber
Publisher : CRC Press
Page : 848 pages
File Size : 12,12 MB
Release : 1997-08-29
Category : Technology & Engineering
ISBN : 9780824793562

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"Affords an advantageous understanding of contemporary management and total quality systems without excessive employment of advanced mathematics--directing managers in the implementation of the basic quality framework that will lead to improved production and increased profits through sound quality practices. Provides practical applications in a wide variety of industrial, financial, service, and administrative systems and shows how to prepare for quality audits, product meetings, and production discussions. Features 21 new chapters."

Author : Parag K. Lala
Publisher : Springer Nature
Page : 99 pages
File Size : 41,63 MB
Release : 2022-06-01
Category : Technology & Engineering
ISBN : 303179785X

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An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References