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Handbook of Optical Dimensional Metrology

Author : Kevin Harding
Publisher : Taylor & Francis
Page : 497 pages
File Size : 47,91 MB
Release : 2016-04-19
Category : Science
ISBN : 1439854823

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Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods

Practical Optical Dimensional Metrology

Author : Kevin G. Harding
Publisher : SPIE-International Society for Optical Engineering
Page : 0 pages
File Size : 10,94 MB
Release : 2019
Category : Metrology
ISBN : 9781510622937

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Provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods. The book concludes with a series of manufacturing application examples.

Handbook of Optical Metrology

Author : Toru Yoshizawa
Publisher : CRC Press
Page : 919 pages
File Size : 21,13 MB
Release : 2017-07-28
Category : Technology & Engineering
ISBN : 1466573619

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Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

Handbook of Optical Metrology

Author : Toru Yoshizawa
Publisher : CRC Press
Page : 746 pages
File Size : 31,44 MB
Release : 2009-02-25
Category : Science
ISBN : 1420019511

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The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.

Practical Optical Dimensional Metrology

Author : Kevin G. Harding
Publisher :
Page : 228 pages
File Size : 41,22 MB
Release : 2019
Category : Electronic books
ISBN : 9781510622944

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Practical Optical Dimensional Metrology provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods that use: light level changes, two-dimensional imaging, triangulation, structured-light patterns, interference patterns, optical focus, light characteristics such as polarization, and hybrid methods with mechanical or other measurement tools. The book concludes with a series of manufacturing application examples that look at measurements from the centimeter range down to the nanometer range.

Handbook of Dimensional Measurement

Author : Francis T. Farago
Publisher : Industrial Press Inc.
Page : 608 pages
File Size : 37,2 MB
Release : 1994
Category : Education
ISBN : 9780831130534

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Nineteen Fact-Filled Charters that contain authoritative treatment of all aspects of dimensional measurement technology make Handbook of Dimensional Measurement the most readable and comprehensive guide available for engineers and technicians engages in the various stages of industrial production. Design engineers, manufacturing engineers, tool and gage makers, quality control specialists, and reliability experts will find a wealth of practical data as well as complete coverage - both basic and advanced - of dimensional measurement techniques and equipment. The Third Edition of this classic book has been completely revised to include the computer and electronics revolution in metrology. Virtually every type of measurement instrument and machine, even the newest devices, can be found in these pages. Hundreds of changes, and additions and scores of new illustrations have been incorporated to assure that Handbook of Dimensional Measurement retains its status as the standard reference for the practitioner of dimensional measurement.

Handbook of Critical Dimension Metrology and Process Control

Author : Kevin M. Monahan
Publisher : SPIE-International Society for Optical Engineering
Page : 376 pages
File Size : 41,64 MB
Release : 1994
Category : Electronic industries
ISBN :

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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Introduction to Optical Metrology

Author : Rajpal S. Sirohi
Publisher : CRC Press
Page : 449 pages
File Size : 42,76 MB
Release : 2017-07-12
Category : Technology & Engineering
ISBN : 1482236117

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Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.

Handbook of Optical Metrology, 2nd Edition

Author : Toru Yoshizawa
Publisher :
Page : 0 pages
File Size : 27,94 MB
Release : 2017
Category :
ISBN :

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Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters-nearly 100 pages-on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

Handbook of Silicon Semiconductor Metrology

Author : Alain C. Diebold
Publisher : CRC Press
Page : 703 pages
File Size : 29,82 MB
Release : 2001-06-29
Category : Technology & Engineering
ISBN : 0203904540

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Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay