[PDF] Electronic Testing And Fault Diagnosis eBook
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Electronic Testing and Fault Diagnosis is a comprehensive and highly practical guide to the theory and methods of testing electronic circuits and systems. The third edition has been fully revised to provide up-to-date coverage of standard test procedures, and reliability and maintainability analysis for most analogue and digital electronic components and circuits. An introduction to automatic test equipment (ATE) is included, as well as data on passive and active components. This book is a key course text for BTEC HNC/D and first year degree courses in electronics, as well as C&G electronics servicing (2240) part II/III. It is also suitable as a supplementary text for the fault diagnosis units of BTEC HNC science and GNVQ advanced engineering courses.
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
The average car now contains much more electronic circuitry than would have been the case, even five years ago. This leaves many technicians struggling to keep up with current developments in the repair and maintenance of these electronic systems. Often, texts covering vehicle electronics dwell on unnecessary maths and general electronics principles. This practical guide discusses electronics ony within the context of the vehicle system under consideration and thus keeps theory to a minimum. Using numerous diagrams, photographs and step by step instructions, this book gives a clear description of vehicle electronic systems and fault diagnosos and than continues on to the testing and repair of these systems. Regular reviews and summaries help consolidate learning and make this book ideal for workshop and classroom use.
IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.
Indhold: Basics of fault diagnosis ; Single stage transistor amplifier ; Power supply circuits ; Amplifier circuits ; Oscillator and time base circuits ; Pulse and waveform shaping circuits ; Thyristor and Triac circuits ; Circuits using analogue and digital integrated circuits ; The fault finding process
This book gives a sufficient grounding in mechanics for engineers to tackle a significant range of problems encountered in the design and specification of simple structures and machines. It also provides an excellent background for students wishing to progress to more advanced studies in three-dimensional mechanics.
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.