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Electron Nano-Imaging

Author : Nobuo Tanaka
Publisher : Springer
Page : 340 pages
File Size : 43,92 MB
Release : 2017-04-04
Category : Technology & Engineering
ISBN : 4431565027

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In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

Electron Nano-imaging

Author : Nobuo Tanaka
Publisher : Springer Nature
Page : 389 pages
File Size : 24,99 MB
Release :
Category :
ISBN : 4431569405

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Nanoimaging

Author : Alioscka A. Sousa
Publisher : Humana Press
Page : 0 pages
File Size : 36,65 MB
Release : 2012-10-21
Category : Medical
ISBN : 9781627031363

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For more than a century, microscopy has been a centerpiece of extraordinary discoveries in biology. Along the way, remarkable imaging tools have been developed allowing scientists to dissect the complexity of cellular processes at the nano length molecular scales. Nanoimaging: Methods and Protocols presents a diverse collection of microscopy techniques and methodologies that provides guidance to successfully image cellular molecular complexes at nanometer spatial resolution. The book's four parts cover: (1) light microscopy techniques with a special emphasis on methods that go beyond the classic diffraction-limited imaging; (2) electron microscopy techniques for high-resolution imaging of molecules, cells and tissues, in both two and three dimensions; (3) scanning probe microscopy techniques for imaging and probing macromolecular complexes and membrane surface topography; and (4) complementary techniques on correlative microscopy, soft x-ray tomography and secondary ion mass spectrometry imaging. Written in the successful format of the Methods in Molecular BiologyTM series, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step protocols, and notes on troubleshooting and avoiding known pitfalls. Authoritative and accessible, Nanoimaging: Methods and Protocols highlights many of the most exciting possibilities in microscopy for the investigation of biological structures at the nano length molecular scales.

Advances in Imaging and Electron Physics

Author :
Publisher : Academic Press
Page : 269 pages
File Size : 26,34 MB
Release : 2015-06-09
Category : Technology & Engineering
ISBN : 0128025905

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Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field

Modeling Nanoscale Imaging in Electron Microscopy

Author : Thomas Vogt
Publisher : Springer Science & Business Media
Page : 190 pages
File Size : 20,96 MB
Release : 2012-03-02
Category : Science
ISBN : 146142190X

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This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Scanning Microscopy for Nanotechnology

Author : Weilie Zhou
Publisher : Springer Science & Business Media
Page : 533 pages
File Size : 41,93 MB
Release : 2007-03-09
Category : Technology & Engineering
ISBN : 0387396209

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Nanocharacterisation

Author : Royal Society of Chemistry (Great Britain)
Publisher : Royal Society of Chemistry
Page : 319 pages
File Size : 15,51 MB
Release : 2007
Category : Science
ISBN : 0854042415

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Nanocharacterisation is a rapidly developing field. Contributions in this book from across the globe provide an overview of the different microscopic techniques for the characterisation of nanostructures.

Advanced Transmission Electron Microscopy

Author : Jian Min Zuo
Publisher : Springer
Page : 0 pages
File Size : 17,80 MB
Release : 2016-10-26
Category : Technology & Engineering
ISBN : 9781493966059

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This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Liquid Cell Electron Microscopy

Author : Frances M. Ross
Publisher : Cambridge University Press
Page : 529 pages
File Size : 12,34 MB
Release : 2017
Category : Science
ISBN : 1107116570

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2.6.2 Electrodes for Electrochemistry

Aberration-corrected Imaging in Transmission Electron Microscopy

Author : Rolf Erni
Publisher : World Scientific
Page : 348 pages
File Size : 49,5 MB
Release : 2010
Category : Science
ISBN : 1848165366

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This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction. The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.