[PDF] Design For Testability Of Asynchronous Vlsi Circuits eBook

Author : M. Bushnell
Publisher : Springer Science & Business Media
Page : 712 pages
File Size : 16,91 MB
Release : 2004-12-15
Category : Technology & Engineering
ISBN : 0792379918

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Author : Luciano Lavagno
Publisher : Springer Science & Business Media
Page : 353 pages
File Size : 32,33 MB
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 1461532124

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Since the second half of the 1980s asynchronous circuits have been the subject of a great deal of research following a period of relative oblivion. The lack of interest in asynchronous techniques was motivated by the progressive shift towards synchronous design techniques that had much more structure and were much easier to verify and synthesize. System design requirements made it impossible to eliminate totally the use of asynchronous circuits. Given the objective difficulty encountered by designers, the asynchronous components of electronic systems such as interfaces became a serious bottleneck in the design process. The use of new models and some theoretical breakthroughs made it possible to develop asynchronous design techniques that were reliable and effective. This book describes a variety of mathematical models and of algorithms that form the backbone and the body of a new design methodology for asyn chronous design. The book is intended for asynchronous hardware designers, for computer-aided tool experts, and for digital designers interested in ex ploring the possibility of designing asynchronous circuits. It requires a solid mathematical background in discrete event systems and algorithms. While the book has not been written as a textbook, nevertheless it could be used as a reference book in an advanced course in logic synthesis or asynchronous design.

Author : Teresa H. Meng
Publisher : Springer Science & Business Media
Page : 179 pages
File Size : 42,67 MB
Release : 2011-06-27
Category : Technology & Engineering
ISBN : 1461527945

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Asynchronous Circuit Design for VLSI Signal Processing is a collection of research papers on recent advances in the area of specification, design and analysis of asynchronous circuits and systems. This interest in designing digital computing systems without a global clock is prompted by the ever growing difficulty in adopting global synchronization as the only efficient means to system timing. Asynchronous circuits and systems have long held interest for circuit designers and researchers alike because of the inherent challenge involved in designing these circuits, as well as developing design techniques for them. The frontier research in this area can be traced back to Huffman's publications `The Synthesis of Sequential Switching Circuits' in 1954 followed by Unger's book, `Asynchronous Sequential Switching Circuits' in 1969 where a theoretical foundation for handling logic hazards was established. In the last few years a growing number of researchers have joined force in unveiling the mystery of designing correct asynchronous circuits, and better yet, have produced several alternatives in automatic synthesis and verification of such circuits. This collection of research papers represents a balanced view of current research efforts in the design, synthesis and verification of asynchronous systems.

Author : Angela Krstic
Publisher : Springer Science & Business Media
Page : 201 pages
File Size : 38,25 MB
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 1461555973

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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

Author : Laung-Terng Wang
Publisher : Elsevier
Page : 809 pages
File Size : 45,59 MB
Release : 2006-08-14
Category : Technology & Engineering
ISBN : 0080474799

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Author : Suman Lata Tripathi
Publisher : CRC Press
Page : 391 pages
File Size : 42,38 MB
Release : 2020-08-19
Category : Technology & Engineering
ISBN : 1000168174

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This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.