[PDF] Atomic Force Microscopy Scanning Nearfield Optical Microscopy And Nanoscratching eBook

Author : Gerd Kaupp
Publisher : Springer Science & Business Media
Page : 302 pages
File Size : 11,21 MB
Release : 2006-10-24
Category : Technology & Engineering
ISBN : 3540284729

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Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Author : Anatoly V. Zayats
Publisher : Artech House
Page : 379 pages
File Size : 15,78 MB
Release : 2009
Category : Science
ISBN : 1596932848

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"This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.

Author :
Publisher :
Page : 0 pages
File Size : 42,12 MB
Release : 2005
Category :
ISBN :

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This project supported a new universal scanning microscope system combining near-field scanning optical microscopy (NSOM), conventional atomic force (AFM) microscopy, and confocal optical microscopy. To build a universal system capable of high-resolution topographical imaging concurrently with spectroscopic abilities, the authors have acquired several independent units and combined them into a custom-designed NSOM/AFM/Raman instrument. They have acquired an atomic force microscope (Multimode, Digital Instruments), a near-field scanning microscope (Aurora III, Digital Instruments, partially supported by NASA), and a SpectraPro Raman spectrograph from Roper. In addition to these major instruments, they acquired a number of supporting parts/instruments toward their goal of completion of the system and sample preparation, selection, and characterization for Raman studies (e.g., CCD camera, avalanche detectors, two lasers, optical parts, air table, fluorescence microscope, mini x-ray unit, etc). A post-doctoral Research Associate was in charge of putting all these parts together. The authors did not go with a single unit from WiTec because actual demonstrations did not show expected sensitivity. This report presents a description of the instrument and preliminary results obtained with it. The instrument was used to collect Raman spectra from patterned arrays of bent single wall carbon nanotubes and bundles (3 nm in diameter) and from freely suspended nanomembranes with encapsulated gold nanoparticles.

Author : Motoichi Ohtsu
Publisher : Springer Science & Business Media
Page : 309 pages
File Size : 17,73 MB
Release : 2012-12-06
Category : Science
ISBN : 4431679375

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Intrinsic features of the optical near field open a new frontier in optical science and technology by finally overcoming the diffraction limit to reach nanometric dimensions. But this book goes beyond near-field optical microscopy to cover local spectroscopy, nanoscale optical processing and storage, quantum near-field optics, and atom manipulation. Near-Field Nano/Atom Optics and Technology provides the first complete and systematically compiled account of the science and technology required to generate the near field, and features applications including imaging of biological specimens and diagnostics for semiconductor nanomaterials and devices. This monograph will be invaluable to researchers who want to implement near-field technology in their own work, and it can also be used as a textbook for graduate or undergraduate students.

Author : Arturo M. Baró
Publisher : John Wiley & Sons
Page : 385 pages
File Size : 48,23 MB
Release : 2012-05-14
Category : Science
ISBN : 3527327584

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About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM

Author : Dror Sarid
Publisher : Oxford University Press
Page : 285 pages
File Size : 32,59 MB
Release : 1994-08-25
Category : Science
ISBN : 0195344693

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Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
Page : 264 pages
File Size : 31,77 MB
Release : 1997-04-30
Category : Science
ISBN : 9780306455964

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Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994

Author : Chun Hong Low
Publisher :
Page : 63 pages
File Size : 12,35 MB
Release : 2008
Category : Atomic force microscopy
ISBN :

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This thesis aims to investigate the optical properties of nano-devices using the technique of Near-Field Scanning Optical Microscopy (NSOM). A unique setup to perform Atomic Force Microscopy (AFM) and NSOM simultaneously in a scanning electron microscope (SEM) to collect spatially resolved luminescence and image transport on nano-scale structures, particularly nanowires, will allow direct determination of transport parameters, such as minority carrier mobility and diffusion length that are vital to the performance of optoelectronic devices. The work involves the development of a unique nano-scale imaging technique applicable to a wide range of structures. The main structures of interest in this thesis will be GaN nanowires. Instead of using a laser for generating charge for imaging, the e-beam from the SEM was used to generate localized charge for an NSOM probe to monitor the motion of the excess charge due to diffusion and/or drift via electron-hole recombination process. For the first time in this research, the author addressed numerous challenges such as the intricate NSOM technique to resolve sub-wavelength dimension measurements of the elements and determine optimized experimental parameters to compensate for the relatively low efficiency of NSOM optical collection. Of significance, transport imaging of 1-10 [micrometer] long GaN nanowires resulted in minority carrier diffusion lengths ranging from 1-2 [micrometer]. An initial experimental exploration was also conducted to determine the theoretical prediction of the unique transmission enhancement of Au nanobowties fabricated on luminescent GaAs heterostructure. The author will report the working principles, experimental procedures, optimal process parameters and the respective imaging results for assessing the properties of the nano-devices studied in this thesis work. Recommendations for future work pertaining to the augmentation of related NSOM work will also be made to ensure continued progress in this area of work.

Author : En-Te Hwu
Publisher : Edwin Hwu
Page : 136 pages
File Size : 49,68 MB
Release : 2014-04-30
Category : Science
ISBN :

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A novel non-contact multiaxial astigmatic detection system (ADS) is designed and developed using the astigmatism as the measuring principle for the translational displacement, the angle, and their variations of a measured surface simultaneously. An optical pickup unit (OPU) of a commercial digital versatile disk (DVD) read only memory (ROM) drive can be used directly as an optical path mechanism in the above mentioned ADS, which can measure the translational and angular displacements accurately and simultaneously. The total linear detection range and the maximum measurement bandwidth of the ADS are 6 mm and 80MHz, respectively. The resolution of the translational displacement measurement is in sub-angstrom scale. For an operating frequency of 700 kHz, the noise floors of the translational and angular signals are below 0.8 pm/Hz1/2 and 0.4 mrad/ Hz1/2, respectively. The ADS can monitor the translational and two orthogonal angular displacements of a micro fabricated cantilever in atomic force microscopy (AFM). All the three, contact non-contact and tapping, modes can resolve the single atomic steps of the graphite surface, which indicates that atomic resolution is achievable with the ADS. The thermal noise spectra of the AFM probe can be clearly measured as well. Furthermore, the accuracy of scanning probe microscopy (SPM) depends not only on the measurement system itself, but also by the accuracy of the signal processing, which further depends on the physical and geometrical characteristics of the probe. The structure of the ADS is compact and stable. Besides the measurements through AFM probes, the ADS can be operated in profilometer mode. The CD surface and the CCD microlens are measured by this mode. The maximum scanning speed can reach up to 3.84×106 mm/s theoretically, almost one million times faster than that of a commercial SPM system. The ADS has a great potential for future development, the expansibility and the accuracy can evolve with the performance of future OPU. From the DVD OPU to higher resolution one, such as the OPU of the Blu-ray drive or high- definition (HD-DVD), can be integrated into the ADS as well. KEYWORDS: Astigmatism, ADS, Translational displacement, Angular displacement, SPM, AFM, Cantilever, Optical profilometer