[PDF] Applications Of Electron Lenses eBook

Author : Peter W. Hawkes
Publisher : Academic Press
Page : 654 pages
File Size : 43,42 MB
Release : 2013-11-06
Category : Science
ISBN : 1483284654

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The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.

Author : Ray Egerton
Publisher : Springer Science & Business Media
Page : 224 pages
File Size : 41,64 MB
Release : 2011-02-11
Category : Technology & Engineering
ISBN : 9780387258003

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Author :
Publisher :
Page : pages
File Size : 41,7 MB
Release : 2014
Category :
ISBN :

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Electron lenses are pulsed, magnetically confined electron beams whose current-density profile is shaped to obtain the desired effect on the circulating beam. Electron lenses were used in the Fermilab Tevatron collider for bunch-by-bunch compensation of long-range beam-beam tune shifts, for removal of uncaptured particles in the abort gap, for preliminary experiments on head-on beam-beam compensation, and for the demonstration of halo scraping with hollow electron beams. Electron lenses for beam-beam compensation are being commissioned in the Relativistic Heavy Ion Collider (RHIC) at Brookhaven National Laboratory (BNL). Hollow electron beam collimation and halo control were studied as an option to complement the collimation system for the upgrades of the Large Hadron Collider (LHC) at CERN; a conceptual design was recently completed. Because of their electric charge and the absence of materials close to the proton beam, electron lenses may also provide an alternative to wires for long-range beam-beam compensation in LHC luminosity upgrade scenarios with small crossing angles. At Fermilab, we are planning to install an electron lens in the Integrable Optics Test Accelerator (IOTA, a 40-m ring for 150-MeV electrons) as one of the proof-of-principle implementations of nonlinear integrable optics to achieve large tune spreads and more stable beams without loss of dynamic aperture.

Author : Lawrence Eugene Murr
Publisher :
Page : 570 pages
File Size : 49,60 MB
Release : 1970
Category : Science
ISBN :

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Problems after each chapter.

Author : Ludwig Reimer
Publisher : Springer
Page : 538 pages
File Size : 14,86 MB
Release : 2013-11-11
Category : Science
ISBN : 3540389679

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Author : Peter W. Hawkes
Publisher : Springer Nature
Page : 1561 pages
File Size : 15,7 MB
Release : 2019-11-02
Category : Technology & Engineering
ISBN : 3030000699

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This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Author : Zhigang Li
Publisher : CRC Press
Page : 640 pages
File Size : 22,31 MB
Release : 2002-12-04
Category : Science
ISBN : 0824745760

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Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.

Author : Gerhard Dehm
Publisher : John Wiley & Sons
Page : 403 pages
File Size : 27,93 MB
Release : 2012-05-30
Category : Technology & Engineering
ISBN : 3527652183

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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Author : Rik Brydson
Publisher : John Wiley & Sons
Page : 235 pages
File Size : 37,35 MB
Release : 2011-08-02
Category : Science
ISBN : 1119979900

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The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).