[PDF] Advances In X Ray Analysis Proceedings Of The Eighth Annual Conference On Application Of X Ray Analysis Denver Research Institute 1959 eBook

Author : William M. Mueller
Publisher : Springer
Page : 376 pages
File Size : 26,41 MB
Release : 2012-10-20
Category : Science
ISBN : 9781468474022

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It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.

Author : Gavin R. Mallett
Publisher : Springer
Page : 544 pages
File Size : 23,44 MB
Release : 1995-12-31
Category : Science
ISBN : 9780306381096

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The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.

Author : William M. Mueller
Publisher : Springer
Page : 568 pages
File Size : 45,93 MB
Release : 2013-05-03
Category : Science
ISBN : 9781468486360

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The Ninth Annual Conference on Applications of X-Ray Anal ysis sponsored by the University of Denver was held August 10, 11,12, 1960, at the Park Lane Hotel in Denver, Colorado. Forty one papers on new developments in X-ray analytical techniques and instrumentation were presented. This volume contains thirty eight of those papers. Research in X-ray analytical methods is a dynamic and expanding area of scientific investigation. Each year exciting and stimulating progress is reported in the various regions of this field. Suitable documentation of the results is the purpose of the series "Advances in X-Ray Analysis. " Participation in the Conference by two distinguished European scientists, Dr. Raymond Castaing of the University of Paris, France, and Dr. Arnold Hargreaves of the Manchester College of Science and Technology, England, was made possible through financial aid provided by the United States Office of Naval Re search. This assistance is greatly appreciated. Major contributions to the conference were made by the following individuals who chaired the technical sessions: Dr. William D. Forgeng, Electro Metallurgical Company, Niagara Falls, New York Dr. Kurt F. J. Heinrich, E. I. du Pont de Nemours and Company, Wilmington, Delaware Mr. Robert A. McCune, University of Denver, Denver, Colorado Dr. Dan McLachlan, Jr. , Stanford Research Institute, Menlo Park, California Dr. William H. Robinson, Carnegie Institute of Technology, Pittsburgh, Pennsylvania Dr.

Author : William M. Mueller
Publisher :
Page : 386 pages
File Size : 31,41 MB
Release : 2012-05-01
Category :
ISBN : 9781258351854

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Contributing Authors Are Paul Lublin, Charles G. Dodd, P. William Zingaro, And Many Others.