[PDF] Advanced X Ray Characterization Techniques eBook

Author : Zainal Arifin Ahmad
Publisher : Trans Tech Publications Ltd
Page : 550 pages
File Size : 15,85 MB
Release : 2012-12-13
Category : Technology & Engineering
ISBN : 3038139416

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Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.

Author : Eric Lifshin
Publisher : John Wiley & Sons
Page : 277 pages
File Size : 48,70 MB
Release : 2008-07-11
Category : Technology & Engineering
ISBN : 3527613757

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Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Author : Ashok Kumar Singh
Publisher : IOS Press
Page : 604 pages
File Size : 33,20 MB
Release : 2005
Category : Medical
ISBN : 9781586035372

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Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.

Author : B.K. Tanner
Publisher : Springer Science & Business Media
Page : 615 pages
File Size : 40,98 MB
Release : 2013-04-17
Category : Science
ISBN : 1475711263

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.

Author : A.K. Tyagi
Publisher : Trans Tech Publications Ltd
Page : 528 pages
File Size : 12,19 MB
Release : 2009-01-02
Category : Technology & Engineering
ISBN : 303813323X

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Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.

Author : Ch Sateesh Kumar
Publisher : CRC Press
Page : 145 pages
File Size : 46,64 MB
Release : 2023-05-04
Category : Technology & Engineering
ISBN : 1000872297

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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features: Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.

Author : Jiajun Wang
Publisher : Springer Nature
Page : 252 pages
File Size : 24,60 MB
Release : 2021-10-02
Category : Technology & Engineering
ISBN : 9811653283

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This book comprehensively outlines synchrotron-based X-ray imaging technologies and their associated applications in gaining fundamental insights into the physical and chemical properties as well as reaction mechanisms of energy materials. In this book the major X-ray imaging technologies utilised, depending on research goals and sample specifications, are discussed. With X-ray imaging techniques, the morphology, phase, lattice and strain information of energy materials in both 2D and 3D can be obtained in an intuitive way. In addition, due to the high penetration of X-rays, operando/in situ experiments can be designed to track the qualitative and quantitative changes of the samples during operation. This book will broader the reader’s view on X-ray imaging techniques and inspire new ideas and possibilities in energy materials research.

Author : B.K. Tanner
Publisher : Springer
Page : 589 pages
File Size : 44,20 MB
Release : 1981-01-01
Category : Science
ISBN : 9780306406287

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.

Author : Sunil K Sinha
Publisher : World Scientific
Page : 430 pages
File Size : 16,82 MB
Release : 2021-03-23
Category : Science
ISBN : 9811231524

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Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.

Author : Michael R. Kessler
Publisher : Trafford Publishing
Page : 204 pages
File Size : 28,49 MB
Release : 2004
Category : Education
ISBN : 1412036399

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Advanced Topics in Characterization of Composites is a product of the ''Characterization of Composite Materials" graduate course in the Department of Mechanical Engineering at The University of Tulsa. It contains a series of chapters describing characterization techniques for polymer-matrix composite materials. Topics covered include: -thermal analysis using DSC, -residual stresses, -single-fiber fragmentation testing, -creep and creep nature, -impact testing, -infrared thermography, -air-coupled ultrasonics, -structural health monitoring, and -fractography. The chapters include comprehensive literature reviews, background information, and best practices in experimental composites evaluation.