[PDF] A New Virtual Test Solution For The Integrated Circuit Product Development Process eBook

Author : Sudarshan Bahukudumbi
Publisher : Artech House
Page : 198 pages
File Size : 15,20 MB
Release : 2010
Category : Technology & Engineering
ISBN : 1596939907

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Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this unique book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions.

Author : Mitsuru Kodama
Publisher : CRC Press
Page : 232 pages
File Size : 12,73 MB
Release : 2016-05-23
Category : Business & Economics
ISBN : 1317114736

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Innovation in technology and services was once the result of specialist knowledge developed within a single corporation; now, a single focus on the development of new products and services is no longer enough. In Interactive Business Communities, Mitsuru Kodama shows how a new business approach can enable managers to access, share and integrate diverse knowledge both inside and outside the corporation using Boundary Networks to operate across more formal organizational and knowledge boundaries at all levels. Drawing on his studies of large corporations in America and the Far East, Mitsuru, shows how different companies have already started to take this path. He explains the kind of networks and strategic partnerships that have emerged and gives practical guidelines on how to begin forming in-house business communities and extending this to interactive business communities with customers and other organizations. This book is a valuable resource for business educators and researchers, and senior executives responsible for strategy, particularly in high-tech industries, will find insights and ideas to tackle 21st century market and business discontinuities.

Author : Erik Larsson
Publisher : Springer Science & Business Media
Page : 418 pages
File Size : 17,15 MB
Release : 2005-11-07
Category : Technology & Engineering
ISBN : 9781402032073

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Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at a high clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the increasing transistor count results in a higher number of possible fault sites. Testing must handle all these new challenges in an efficient manner having a global system perspective. Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and responses) generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (IEEE std 1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution. SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Author : Luciano Lavagno
Publisher : CRC Press
Page : 798 pages
File Size : 20,41 MB
Release : 2017-02-03
Category : Technology & Engineering
ISBN : 1482254611

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The second of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology thoroughly examines real-time logic (RTL) to GDSII (a file format used to transfer data of semiconductor physical layout) design flow, analog/mixed signal design, physical verification, and technology computer-aided design (TCAD). Chapters contributed by leading experts authoritatively discuss design for manufacturability (DFM) at the nanoscale, power supply network design and analysis, design modeling, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on 3D circuit integration and clock design Offering improved depth and modernity, Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

Author :
Publisher :
Page : 376 pages
File Size : 27,61 MB
Release : 1995
Category : Aeronautics
ISBN :

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Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

Author : Arshad Iqbal
Publisher : Bushra Arshad
Page : 133 pages
File Size : 37,88 MB
Release : 2019-06-11
Category : Computers
ISBN :

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