Author :
Publisher :
Page : pages
File Size : 29,14 MB
Release : 2017
Category : Integrated circuits
ISBN : 9781538623329
[PDF] 2017 Ieee International Integrated Reliability Workshop Iirw eBook
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2017 IEEE International Integrated Reliability Workshop (IIRW)
Author : IEEE Staff
Publisher :
Page : pages
File Size : 28,53 MB
Release : 2017-10-08
Category :
ISBN : 9781538623336
The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems Topics include resistive memories, high k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low k dielectrics, impact of transistor degradation on circuit reliability, MEMS and sensor reliability, designing in reliability (products, circuits, systems, processes), customer product reliability requirements manufacturer reliability tasks, wafer level reliability tests (test approaches and reliability test structures), reliability modeling and simulation, optoelectronics, and single event upsets
2019 IEEE International Integrated Reliability Workshop (IIRW)
Author :
Publisher :
Page : pages
File Size : 24,1 MB
Release : 2019
Category : Integrated circuits
ISBN : 9781728122038
2018 International Integrated Reliability Workshop (IIRW).
Author :
Publisher :
Page : pages
File Size : 27,46 MB
Release : 2018
Category : Integrated circuits
ISBN : 9781538660393
2015 IEEE International Integrated Reliability Workshop (IIRW)
Author :
Publisher :
Page : pages
File Size : 13,18 MB
Release :
Category :
ISBN :
2013 IEEE International Integrated Reliability Workshop (IIRW)
Author : IEEE Staff
Publisher :
Page : pages
File Size : 34,39 MB
Release : 2013-10-13
Category : Technology & Engineering
ISBN : 9781479903498
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW 2014)
Author :
Publisher :
Page : 187 pages
File Size : 43,21 MB
Release : 2014
Category :
ISBN : 9781479972746
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)
Author : IEEE Staff
Publisher :
Page : pages
File Size : 29,27 MB
Release : 2014-10-12
Category :
ISBN : 9781479972753
The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems
2020 IEEE International Integrated Reliability Workshop (IIRW)
Author : IEEE Staff
Publisher :
Page : pages
File Size : 13,31 MB
Release : 2020-10-04
Category :
ISBN : 9781728170596
he IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems
Special Issue on the 2006 International Integrated Reliability Workshop
Author : Yuan Chen
Publisher :
Page : 118 pages
File Size : 18,68 MB
Release : 2007
Category :
ISBN :