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2017 IEEE International Integrated Reliability Workshop (IIRW)

Author : IEEE Staff
Publisher :
Page : pages
File Size : 28,53 MB
Release : 2017-10-08
Category :
ISBN : 9781538623336

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The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems Topics include resistive memories, high k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low k dielectrics, impact of transistor degradation on circuit reliability, MEMS and sensor reliability, designing in reliability (products, circuits, systems, processes), customer product reliability requirements manufacturer reliability tasks, wafer level reliability tests (test approaches and reliability test structures), reliability modeling and simulation, optoelectronics, and single event upsets

2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)

Author : IEEE Staff
Publisher :
Page : pages
File Size : 29,27 MB
Release : 2014-10-12
Category :
ISBN : 9781479972753

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The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems

2020 IEEE International Integrated Reliability Workshop (IIRW)

Author : IEEE Staff
Publisher :
Page : pages
File Size : 13,31 MB
Release : 2020-10-04
Category :
ISBN : 9781728170596

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he IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems