Author :
Publisher : IEEE
Page : 161 pages
File Size : 20,63 MB
Release : 2008
Category : Computers
ISBN : 9781424440016
[PDF] 2008 Ieee International Integrated Reliability Workshop Final Report eBook
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2008 IEEE International Integrated Reliability Workshop Final Report
Author :
Publisher :
Page : pages
File Size : 24,4 MB
Release : 2008
Category : Integrated circuits
ISBN :
2008 IEEE International Integrated Reliability Workshop
Electron Devices Society
Author : Electron Devices Society
Publisher :
Page : 161 pages
File Size : 15,79 MB
Release : 2008
Category :
ISBN : 9781424421947
2001 IEEE International Integrated Reliability Workshop
IEEE Electron Devices Society
Author : IEEE Electron Devices Society
Publisher : IEEE
Page : 106 pages
File Size : 23,44 MB
Release : 2001
Category : Technology & Engineering
ISBN : 9780780371675
International Integrated Reliability Workshop Final Report
Author :
Publisher :
Page : 202 pages
File Size : 47,25 MB
Release : 2005
Category : Integrated circuits
ISBN :
Integrated Reliability Workshop Final Report, 2007 IEEE International
Author :
Publisher :
Page : pages
File Size : 12,37 MB
Release :
Category :
ISBN :
2011 IEEE International Integrated Reliability Workshop Final Report
IEEE Staff
Author : IEEE Staff
Publisher :
Page : 164 pages
File Size : 33,20 MB
Release : 2011-10-16
Category : Integrated circuits
ISBN : 9781457701139
1996 IEEE International Integrated Reliability Workshop Final Report
Author :
Publisher :
Page : 0 pages
File Size : 16,50 MB
Release : 1997
Category :
ISBN :
2011 IEEE International Integrated Reliability Workshop Final Report
Author :
Publisher :
Page : 164 pages
File Size : 35,97 MB
Release : 2011
Category : Integrated circuits
ISBN :
Circuit Design for Reliability
Ricardo Reis
Author : Ricardo Reis
Publisher : Springer
Page : 271 pages
File Size : 45,85 MB
Release : 2014-11-08
Category : Technology & Engineering
ISBN : 1461440785
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.