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Electron Scattering From Complex Nuclei V36B

Author : Herbert Uberall
Publisher : Elsevier
Page : 416 pages
File Size : 46,76 MB
Release : 2012-12-02
Category : Science
ISBN : 0323151248

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Electron Scattering from Complex Nuclei, Part B is a three-chapter text that explores the excitation of the nucleus to bound levels and the nucleus breakup through particle emission from continuum states. The first chapter discusses the inelastic scattering to nuclear levels, the giant resonances, the concepts of radiative corrections, and the phase shift analysis for inelastic scattering. The subsequent chapter concerns the quasi-elastic continuum and the observations of the nuclear decay products. The last chapter presents special topics on electron scattering, such as dispersion and exchange corrections, sum rules, and isospin effects. Physicists, researchers, and graduate students will find this book invaluable.

A New Method for Analysing Inelastic Electron Scattering

Author : W. K. Koo
Publisher :
Page : pages
File Size : 37,39 MB
Release : 1994
Category :
ISBN :

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The inelastic electron scattering form factor can be analysed by using the energy weighted sum rules. The B(E ) and the transition radii Rtr can be obtained directly without having first to obtain the transition charge densities. [Author's abstract].

Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Author : Zhong-lin Wang
Publisher : Springer Science & Business Media
Page : 461 pages
File Size : 12,13 MB
Release : 2013-06-29
Category : Science
ISBN : 1489915796

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Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.