[PDF] Proceedings Microscopy And Microanalysis 2002 Volume 8 eBook

Author : Microscopy Society of America
Publisher : Cambridge University Press
Page : 556 pages
File Size : 20,22 MB
Release : 2002-12-16
Category : Science
ISBN : 9780521824057

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This Proceedings volume contains extended abstracts of all the papers presented by microscopists in both the materials and life sciences at the Microscopy and Microanalysis 2002 meeting held in Québec City, Québec, Canada on August 4-9, 2002. The Proceedings consists of both a printed volume containing the extended abstracts of all invited papers as well as a searchable CD-ROM containing the extended abstracts of all papers presented at the meeting --whether invited or submitted, platform or poster.

Author : Lawrence V. Olivante
Publisher : Nova Publishers
Page : 370 pages
File Size : 25,38 MB
Release : 2008
Category : Technology & Engineering
ISBN : 9781600216541

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Materials science includes those parts of chemistry and physics that deal with the properties of materials. It encompasses four classes of materials, the study of each of which may be considered a separate field: metals; ceramics; polymers and composites. Materials science is often referred to as materials science and engineering because it has many applications. Industrial applications of materials science include processing techniques (casting, rolling, welding, ion implantation, crystal growth, thin-film deposition, sintering, glassblowing, etc), analytical techniques (electron microscopy, x-ray diffraction, calorimetry, nuclear microscopy (HEFIB) etc.), materials design, and cost/benefit tradeoffs in industrial production of materials. This new book presents new leading-edge research in the field.

Author : Khan Maaz
Publisher : BoD – Books on Demand
Page : 396 pages
File Size : 24,75 MB
Release : 2012-04-04
Category : Technology & Engineering
ISBN : 9535104500

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The book "The Transmission Electron Microscope" contains a collection of research articles submitted by engineers and scientists to present an overview of different aspects of TEM from the basic mechanisms and diagnosis to the latest advancements in the field. The book presents descriptions of electron microscopy, models for improved sample sizing and handling, new methods of image projection, and experimental methodologies for nanomaterials studies. The selection of chapters focuses on transmission electron microscopy used in material characterization, with special emphasis on both the theoretical and experimental aspect of modern electron microscopy techniques. I believe that a broad range of readers, such as students, scientists and engineers will benefit from this book.

Author : John Carpenter
Publisher : Springer
Page : 773 pages
File Size : 16,17 MB
Release : 2016-12-20
Category : Technology & Engineering
ISBN : 3319481916

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This collection focuses on the characterization of minerals, metals, and materials as well as the application of characterization results on the processing of these materials. Papers cover topics such as clays, ceramics, composites, ferrous metals, non-ferrous metals, minerals, electronic materials, magnetic materials, environmental materials, advanced materials, and soft materials. In addition, papers covering materials extraction, materials processing, corrosion, welding, solidification, and method development are included. This book provides a current snapshot of characterization in materials science and its role in validating, informing, and driving current theories in the field of materials science. This volume will serve the dual purpose of furnishing a broad introduction of the field to novices while simultaneously serving to keep subject matter experts up-to-date.

Author : Lucille A. Giannuzzi
Publisher : Springer Science & Business Media
Page : 362 pages
File Size : 10,85 MB
Release : 2006-05-18
Category : Science
ISBN : 038723313X

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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.