[PDF] Lsi Integrated Circuit Test Development eBook

Author : Andrzej Jakubowski
Publisher : World Scientific
Page : 382 pages
File Size : 33,16 MB
Release : 1991
Category : Technology & Engineering
ISBN : 9789810202828

GET BOOK

This book describes means in improving the technology of LSI/VLSI ICs production. It does so by concentrating on improvements of manufacturing yield and quality of the products by detecting weak points which should be eliminated on the way up the learning curve. The book presents a systematic approach to the problem, covering primarily methods based on the use of test patterns measurements, in both mass production and in research and development activities. The main groups of defects found in IC chips and ways to detect them using test structures are discussed in detail.

Author : Ian A. Grout
Publisher : Springer Science & Business Media
Page : 396 pages
File Size : 36,24 MB
Release : 2005-08-22
Category : Technology & Engineering
ISBN : 9781846280238

GET BOOK

Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively

Author : Allen Buckroyd
Publisher : Butterworth-Heinemann
Page : 183 pages
File Size : 28,94 MB
Release : 2015-07-14
Category : Technology & Engineering
ISBN : 1483144496

GET BOOK

In-Circuit Testing discusses what an in-circuit test (ICT) is and what it can and cannot do. It answers many questions on how tests are actually carried out, with the benefits and drawbacks of the techniques. The emphasis throughout is towards practical problem solving, and many of the examples used are of surface mount printed circuit boards (PCBs). The book contains separate chapters on application—fitting ICT into a typical test strategy and into the manufacturing environment. The buying decision is fully explored—choice of system, initial and ongoing costs, and preparation of the financial proposal to Management. Then, assuming the automatic test equipment (ATE) has been purchased, additional chapters are devoted to: programming problems and solutions, interfacing problems and solutions, fault diagnosis and fault finding tools. Design for in-circuit test also merits a chapter. This covers specific design guides and the constraints which need to be placed on designers to ensure that ICT is cost effective. The concluding chapter reviews the purchase and use of the chosen ICT with the benefit of hindsight; it covers cost effectiveness; looks at alternative methods of testing, programming, and interfacing; and alternative ways of costing the testing service. This book is written for potential purchasers and users of in-circuit automatic testers who are attracted to the concept of ICT, but who may need help. This includes Test Engineering Managers who need guidance on which equipment to buy for a given application (and how to financially justify the purchase), and ATE Programmers, Test Engineers and Technicians who would welcome practical advice on how best to use the chosen ATE.

Author : D.F. Barbe
Publisher : Springer Science & Business Media
Page : 291 pages
File Size : 25,50 MB
Release : 2013-04-17
Category : Technology & Engineering
ISBN : 3662010038

GET BOOK

Even elementary school students of today know that electronics can do fan tastic things. Electronic calculators make arithmetic easy. An electronic box connected to your TV set provides a wonderful array of games. Electron ic boxes can translate languages! Electronics has even changed watches from a pair of hands to a set of digits. Integrated circuit (IC) chips which use transistors to store information in binary form and perform bin ary arithmetic make all of this possible. In just a short twenty years the field of integrated circuits has progressed from a few transistors per chip to thousands of transistors per chip. Since the early 1960's, the field has progressed from chips containing several transistors performing simple functions such as OR and AND functions to chips presently available which contain thousands of transistors performing a wide range of memory, control and arithmetic functions. The number of special journal issues, conferences, workshops, seminars, etc. related to the field of IC's is large. l~hile no single volume could adequately summarize the field, this volume attempts to provide a summary of some of the important issues and factors for Very Large Scale Integra tion (VLSI) from the perspective of several authors deeply involved in the field. In the field of VLSI, composed of many facets and disciplines, the de mand for engineers, physicists and chemists trained in IC skills exceeds supply.