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Diagnostic Measurements in LSI/VLSI Integrated Circuits Production

Author : Andrzej Jakubowski
Publisher : World Scientific
Page : 382 pages
File Size : 10,38 MB
Release : 1991
Category : Technology & Engineering
ISBN : 9789810202828

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This book describes means in improving the technology of LSI/VLSI ICs production. It does so by concentrating on improvements of manufacturing yield and quality of the products by detecting weak points which should be eliminated on the way up the learning curve. The book presents a systematic approach to the problem, covering primarily methods based on the use of test patterns measurements, in both mass production and in research and development activities. The main groups of defects found in IC chips and ways to detect them using test structures are discussed in detail.

Broadband Matching: Theory And Implementations (3rd Edition)

Author : Wai-kai Chen
Publisher : World Scientific
Page : 879 pages
File Size : 48,87 MB
Release : 2015-10-13
Category : Technology & Engineering
ISBN : 9814619086

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The third edition presents a unified, up-to-date and detailed account of broadband matching theory and its applications to the design of broadband matching networks and amplifiers. A special feature is the addition of results that are of direct practical value. They are design curves, tables and explicit formulas for designing networks having Butterworth, Chebyshev or elliptic, Bessel or maximally flat group-delay response. These results are extremely useful as the design procedures can be reduced to simple arithmetic. Two case studies towards the end of the book are intended to demonstrate the applications to the practical design of modern filter circuits.

RADECS ...

Author :
Publisher :
Page : 646 pages
File Size : 46,72 MB
Release : 1999
Category : Electronic apparatus and appliances
ISBN :

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