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Author : Benjamin C. Olbricht
Publisher :
Page : 185 pages
File Size : 36,23 MB
Release : 2010
Category : Electrooptics
ISBN :
Author : Carl W. Dirk
Publisher : Routledge
Page : 914 pages
File Size : 18,3 MB
Release : 2018-05-11
Category : Science
ISBN : 135146180X
""Furnishes table of nonlinear optical properties of organic substances as well as experimental procedures for measuring the nonlinearity of the elements tabulated, including composite materials-offering support for scientists and engineers involved in characterizing, optimizing, and producing materials for manufacturing optical devices.
Author : Mark G. Kuzyk
Publisher : CRC Press
Page : 911 pages
File Size : 26,51 MB
Release : 2018-05-11
Category : Science
ISBN : 1351461818
""Furnishes table of nonlinear optical properties of organic substances as well as experimental procedures for measuring the nonlinearity of the elements tabulated, including composite materials-offering support for scientists and engineers involved in characterizing, optimizing, and producing materials for manufacturing optical devices.
Author : Ch. Bosshard
Publisher : CRC Press
Page : 266 pages
File Size : 37,47 MB
Release : 2001-08-24
Category : Technology & Engineering
ISBN : 9782884490078
Organic Nonlinear Optical Materials provides an extensive description of the preparation and characterization of organic materials for applications in nonlinear and electro-optics. The book discusses the fundamental optimization and practical limitations of a number of figures of merit for various optical parameters and gives a clinical appraisal of the potential of organic materials for applicators in optical technology. Among the topics addressed are the basic molecular design of ;nonlinear optical chromophores, fundamentals and novel techniques of organic crystal growth, preparation and characterization of Langmuir-Blodgett and polymer films, experimental methods for determining microscopic and macroscopic optical properties. Also included is a discussion of first results of the photorefractive effect in organic crystals and the potential of organics for photorefractive applications, as well as an extensive review of published linear and nonlinear optical measurement of organic materials.
Author : Seizo Miyata
Publisher : CRC Press
Page : 264 pages
File Size : 49,1 MB
Release : 2000-12-21
Category : Science
ISBN : 9789056992705
This monograph contains all major achievements and future insights in the field of optical communication systems. It covers the molecular design and synthesis of new organic compounds, processing, processing of materials and their characterization due to novel techniques, device fabrications and assessment of optical devices in display and information processing.
Author : Thierry Verbiest
Publisher : CRC Press
Page : 202 pages
File Size : 20,37 MB
Release : 2009-02-19
Category : Science
ISBN : 1420070738
Although chemists, biochemists, biologists, and material scientists are often interested in using nonlinear optical techniques for characterizing their samples, they seldom have the necessary background to exploit these methods. Designed for nonspecialists, Second-Order Nonlinear Optical Characterization Techniques: An Introduction focuses on the p
Author : Peter Günter
Publisher : Springer
Page : 550 pages
File Size : 20,11 MB
Release : 2012-12-06
Category : Science
ISBN : 3540497137
Describing progress achieved in the field of nonlinear optics and nonlinear optical materials, the Handbook treats selected topics such as photorefractive materials, third-order nonlinear optical materials and organic nonlinear optical crystals, as well as electro-optic polymers. Applications of photorefractive materials in optical memories, optical processing, and guided-wave nonlinear optics in hotorefractive waveguides are described. As light will play a more and more dominant role as an information carrier, the review of existing and new materials given here makes this a keystone book in the field.
Author :
Publisher :
Page : 416 pages
File Size : 26,93 MB
Release : 1968
Category : Weights and measures
ISBN :
Author : K. Vedam
Publisher : Academic Press
Page : 345 pages
File Size : 23,29 MB
Release : 2013-10-22
Category : Science
ISBN : 1483288935
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
Author : Andrew T. S. Wee
Publisher : John Wiley & Sons
Page : 213 pages
File Size : 39,42 MB
Release : 2022-03-08
Category : Technology & Engineering
ISBN : 3527833951
A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.