[PDF] Cavity Enhanced Spectroscopy Methods For Analysis Of Thin Films eBook

Cavity Enhanced Spectroscopy Methods For Analysis Of Thin Films Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of Cavity Enhanced Spectroscopy Methods For Analysis Of Thin Films book. This book definitely worth reading, it is an incredibly well-written.

Time-resolved Spectroscopy of Two-dimensional Systems

Author : Neus Allande Calvet
Publisher :
Page : 0 pages
File Size : 21,86 MB
Release : 2023*
Category :
ISBN :

GET BOOK

The work presented in this dissertation is dedicated to the characterization of the excited state dynamics of thin films through time-resolved spectroscopy, with emphasis on developing a methodology that is able to resolve weak transient absorption signals from optically thin films. With this aim, the conventional transient absorption spectroscopy method is first utilized to characterize semiconducting monolayers and organic nanosheet semiconductors. Although these are physically thin, they present relatively strong transient absorption signals of a few mOD (units of optical density), which allows to characterize their excited state dynamics with the conventional machinery, not needing further signal enhancements or complex noise-minimizing techniques. Nonetheless, the former does not represent the reality of detecting the transient photoexcited dynamics of few-layered systems. For this reason, the last chapter of this thesis introduces a new approach for the sensitive detection of two-dimensional samples with marginal molecular extinction coefficients: A novel methodology that multiplies the interaction length of the light with the sample, designated cavity ring-down transient absorption spectroscopy (CRD-TAS). Being at the present time in the midst of its development, the prospect efficiency and working capabilities of the novel CRD-TAS technique are hereby evaluated, and the strategies for further improvements are discussed.

Cavity Ring-Down Spectroscopy

Author : Giel Berden
Publisher : John Wiley & Sons
Page : 344 pages
File Size : 47,74 MB
Release : 2009-08-11
Category : Science
ISBN : 9781444308242

GET BOOK

Cavity Ring-Down Spectroscopy: Techniques and Applications provides a practical overview of this valuable analytical tool, explaining the fundamental concepts and experimental methods, and illustrating important applications. Designed as both an introductory text and a reference source, this book is relevant for scientists unfamiliar with CRDS who are interested in using the technique in their research, as well as experienced users.

Cavity-Enhanced Spectroscopies

Author : Roger van Zee
Publisher : Elsevier
Page : 343 pages
File Size : 26,78 MB
Release : 2003-01-08
Category : Science
ISBN : 0080531415

GET BOOK

"Cavity-Enhanced Spectroscopy" discusses the use of optical resonators and lasers to make sensitive spectroscopic measurements. This volume is written by the researcchers who pioneered these methods. The book reviews both the theory and practice behind these spectroscopic tools and discusses the scientific discoveries uncovered by these techniques. It begins with a chapter on the use of optical resonators for frequency stabilization of lasers, which is followed by in-depth chapters discussing cavity ring-down spectroscopy, frequency-modulated, cavity-enhanced spectroscopy, intracavity spectroscopies, microresonators and cavity-enhanced comb filters. This book is aimed towards a reader with a background in optics and spectroscopy, but who is unfamiliar with the methods discussed in the book. *Practical implementation informationComprehensive review of cavity-enhanced methods*Written by the researchers who pioneered these spectroscopies*Discusses cavity-enhanced optical instrumentationReviews scientific discoveries unearthed using these methods

Surface and Thin Film Analysis

Author : Gernot Friedbacher
Publisher : John Wiley & Sons
Page : 514 pages
File Size : 38,23 MB
Release : 2011-03-31
Category : Technology & Engineering
ISBN : 3527636935

GET BOOK

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)

Cavity-Enhanced Spectroscopy and Sensing

Author : Gianluca Gagliardi
Publisher : Springer
Page : 537 pages
File Size : 22,17 MB
Release : 2013-10-19
Category : Science
ISBN : 3642400035

GET BOOK

The book reviews the dramatic recent advances in the use of optical resonators for high sensitivity and high resolution molecular spectroscopy as well as for chemical, mechanical and physical sensing. It encompasses a variety of cavities including those made of two or more mirrors, optical fiber loops, fiber gratings and spherical cavities. The book focuses on novel techniques and their applications. Each chapter is written by an expert and/or pioneer in the field. These experts also provide the theoretical background in optics and molecular physics where needed. Examples of recent breakthroughs include the use of frequency combs (Nobel prize 2005) for cavity enhanced sensing and spectroscopy, the use of novel cavity materials and geometries, the development of optical heterodyne detection techniques combined to active frequency-locking schemes. These methods allow the use and interrogation of optical resonators with a variety of coherent light sources for trace gas detection and sensing of strain, temperature and pressure.

Introduction to Spectroscopic Ellipsometry of Thin Film Materials

Author : Andrew Thye Shen Wee
Publisher : John Wiley & Sons
Page : 213 pages
File Size : 40,21 MB
Release : 2022-04-11
Category : Technology & Engineering
ISBN : 3527349510

GET BOOK

A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

Fundamentals of Surface and Thin Film Analysis

Author : Leonard C. Feldman
Publisher :
Page : 384 pages
File Size : 18,59 MB
Release : 1986
Category : Mathematics
ISBN :

GET BOOK

Contains concise coverage of the major analytical techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectroscopy and RBS methods. Annotation copyrighted by Book News, Inc., Portland, OR