[PDF] 2017 Ieee 35th Vlsi Test Symposium Vts eBook

Author : IEEE Staff
Publisher :
Page : pages
File Size : 39,75 MB
Release : 2017-04-09
Category :
ISBN : 9781509044832

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The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems

Author : S. Rajaram
Publisher : Springer
Page : 722 pages
File Size : 34,27 MB
Release : 2019-01-24
Category : Computers
ISBN : 9811359504

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This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

Author : VLSI Test Symposium
Publisher : I E E E
Page : 472 pages
File Size : 23,6 MB
Release : 1998
Category : Computers
ISBN : 9780818684364

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This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.

Author : Mark Tehranipoor
Publisher : Springer Nature
Page : 602 pages
File Size : 21,54 MB
Release : 2021-04-30
Category : Technology & Engineering
ISBN : 3030644480

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This book provides an overview of emerging topics in the field of hardware security, such as artificial intelligence and quantum computing, and highlights how these technologies can be leveraged to secure hardware and assure electronics supply chains. The authors are experts in emerging technologies, traditional hardware design, and hardware security and trust. Readers will gain a comprehensive understanding of hardware security problems and how to overcome them through an efficient combination of conventional approaches and emerging technologies, enabling them to design secure, reliable, and trustworthy hardware.

Author : Haoxing Ren
Publisher : Springer Nature
Page : 585 pages
File Size : 24,92 MB
Release : 2023-01-01
Category : Technology & Engineering
ISBN : 303113074X

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​This book serves as a single-source reference to key machine learning (ML) applications and methods in digital and analog design and verification. Experts from academia and industry cover a wide range of the latest research on ML applications in electronic design automation (EDA), including analysis and optimization of digital design, analysis and optimization of analog design, as well as functional verification, FPGA and system level designs, design for manufacturing (DFM), and design space exploration. The authors also cover key ML methods such as classical ML, deep learning models such as convolutional neural networks (CNNs), graph neural networks (GNNs), generative adversarial networks (GANs) and optimization methods such as reinforcement learning (RL) and Bayesian optimization (BO). All of these topics are valuable to chip designers and EDA developers and researchers working in digital and analog designs and verification.